Authors:
Ito, Y
Utsugi, T
Ohyama, Y
Ohno, T
Uchiyama, T
Tomono, S
Kawazu, S
Kurabayashi, M
Citation: Y. Ito et al., Role of blood pressure in the progression of microalbuminuria in elderly Japanese type 2 diabetic patients: a 7-year follow-up study, J INT MED R, 29(4), 2001, pp. 280-286
Authors:
Kawazu, S
Komaki, K
Tsuji, N
Kawai, S
Ikenoue, N
Hatabu, T
Ishikawa, H
Matsumoto, Y
Himeno, K
Kano, S
Citation: S. Kawazu et al., Molecular characterization of a 2-Cys peroxiredoxin from the human malariaparasite Plasmodium falciparum, MOL BIOCH P, 116(1), 2001, pp. 73-79
Authors:
Uchida, T
Eikyu, K
Tsukuda, E
Fujinaga, M
Teramoto, A
Yamashita, T
Kunikiyo, T
Ishikawa, K
Kotani, N
Kawazu, S
Hamaguchi, C
Nishimura, T
Citation: T. Uchida et al., Simulation of dopant redistribution during gate oxidation including transient-enhanced diffusion caused by implantation damage, JPN J A P 1, 39(5A), 2000, pp. 2565-2576
Authors:
Uchiyama, T
Kurabayashi, M
Ohyama, Y
Utsugi, T
Akuzawa, N
Sato, M
Tomono, S
Kawazu, S
Nagai, R
Citation: T. Uchiyama et al., Hypoxia induces transcription of the plasminogen activator inhibitor-1 gene through genistein-sensitive tyrosine kinase pathways in vascular endothelial cells, ART THROM V, 20(4), 2000, pp. 1155-1161
Authors:
Kawazu, S
Tsuji, N
Hatabu, T
Kawai, S
Matsumoto, Y
Kano, S
Citation: S. Kawazu et al., Molecular cloning and characterization of a peroxiredoxin from the human malaria parasite Plasmodium falciparum, MOL BIOCH P, 109(2), 2000, pp. 165-169
Authors:
Utsugi, T
Ohno, T
Ohyama, Y
Uchiyama, T
Saito, Y
Matsumura, Y
Aizawa, H
Itoh, H
Kurabayashi, M
Kawazu, S
Tomono, S
Oka, Y
Suga, T
Kuro-o, M
Nabeshima, Y
Nagai, R
Citation: T. Utsugi et al., Decreased insulin production and increased insulin sensitivity in the Klotho mutant mouse, a novel animal model for human aging, METABOLISM, 49(9), 2000, pp. 1118-1123
Authors:
Utsugi, T
Yoshida, A
Kanda, T
Kobayashi, I
Kurabayashi, M
Tomono, S
Kawazu, S
Tajima, Y
Nagai, R
Citation: T. Utsugi et al., Oral administration of branched chain amino acids improves virus-induced glucose intolerance in mice, EUR J PHARM, 398(3), 2000, pp. 409-414
Authors:
Katayama, T
Yamamoto, H
Ikeno, M
Mashiko, Y
Kawazu, S
Umeno, M
Citation: T. Katayama et al., Accurate thickness determination of both thin SiO2 on Si and thin Si on SiO2 by angle-resolved X-ray photoelectron spectroscopy, JPN J A P 1, 38(7A), 1999, pp. 4172-4179
Authors:
Katayama, T
Yamamoto, H
Mashiko, Y
Koyama, H
Kawazu, S
Umeno, M
Citation: T. Katayama et al., Kikuchi-band analysis of X-ray photoelectron diffraction fine structure ofSi(100) by precise angle-resolved X-ray photoelectron spectroscopy, JPN J A P 1, 38(3A), 1999, pp. 1547-1552
Authors:
Katayama, T
Yamamoto, H
Ikeno, M
Mashiko, Y
Kawazu, S
Umeno, M
Citation: T. Katayama et al., Effect of ultrathin top silicon layers on the X-ray photoelectron emissionfrom the buried oxide in silicon-on-insulator wafers, JPN J A P 2, 38(9AB), 1999, pp. L1058-L1061
Authors:
Katayama, T
Yamamoto, H
Ikeno, M
Mashiko, Y
Kawazu, S
Umeno, M
Citation: T. Katayama et al., Elimination of X-ray photoelectron diffraction effect of Si(100) for accurate determination of SiO2 overlayer thickness, JPN J A P 2, 38(7A), 1999, pp. L770-L773
Authors:
Fujinaga, M
Kunikiyo, T
Uchida, T
Tsukuda, E
Sonoda, K
Eikyu, K
Ishikawa, K
Nishimura, T
Kawazu, S
Citation: M. Fujinaga et al., 3-D topography and impurity integrated process simulator (3-D MIPS) and its applications, IEICE TR EL, E82C(6), 1999, pp. 848-861
Authors:
Chansiri, K
Kawazu, S
Kamio, T
Terada, Y
Fujisaki, K
Philippe, H
Sarataphan, N
Citation: K. Chansiri et al., Molecular phylogenetic studies on Theileria parasites based on small subunit ribosomal RNA gene sequences, VET PARASIT, 83(2), 1999, pp. 99-105
Authors:
Kawazu, S
Kamio, T
Kakuda, T
Terada, Y
Sugimoto, C
Fujisaki, K
Citation: S. Kawazu et al., Phylogenetic relationships of the benign Theileria species in cattle and Asian buffalo based on the major piroplasm surface protein (p33/34) gene sequences, INT J PARAS, 29(4), 1999, pp. 613-618
Authors:
Mazumder, MK
Teramoto, A
Komori, J
Sekine, M
Kawazu, S
Mashiko, Y
Citation: Mk. Mazumder et al., Effects of N distribution on charge trapping and TDDB characteristics of N2O annealed wet oxide, IEEE DEVICE, 46(6), 1999, pp. 1121-1126