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Results: 1-10 |
Results: 10
Misfit relaxation of the AlN/Al2O3 (0001) interface - art. no. 195329
Authors: Kehagias, T Komninou, P Nouet, G Ruterana, P Karakostas, T
Citation: T. Kehagias et al., Misfit relaxation of the AlN/Al2O3 (0001) interface - art. no. 195329, PHYS REV B, 6419(19), 2001, pp. 5329
Structural properties of ZnSe epilayers on (111) GaAs
Authors: Kontos, AG Chrysanthakopoulos, N Calamiotou, M Kehagias, T Komninou, P Pohl, UW
Citation: Ag. Kontos et al., Structural properties of ZnSe epilayers on (111) GaAs, J APPL PHYS, 90(7), 2001, pp. 3301-3307
The microstructure and electrical properties of directly deposited TiN ohmic contacts to gallium nitride.
Authors: Ruterana, P Nouet, G Kehagias, T Komninou, P Karakostas, T Poisson, MAD Huet, F
Citation: P. Ruterana et al., The microstructure and electrical properties of directly deposited TiN ohmic contacts to gallium nitride., MRS I J N S, 5, 2000, pp. NIL_762-NIL_767
Interfacial dislocations in TiN/GaN thin films
Authors: Komninou, P Dimitrakopulos, GP Nouet, G Kehagias, T Ruterana, P Karakostas, T
Citation: P. Komninou et al., Interfacial dislocations in TiN/GaN thin films, J PHYS-COND, 12(49), 2000, pp. 10295-10300
Crystalline structures of carbon complexes in amorphous carbon films
Authors: Komninou, P Nouet, G Patsalas, P Kehagias, T Gioti, M Logothetidis, S Karakostas, T
Citation: P. Komninou et al., Crystalline structures of carbon complexes in amorphous carbon films, DIAM RELAT, 9(3-6), 2000, pp. 703-706
Improved growth and perpendicular anisotropy in Pd-Co multilayers with intentionally alloyed layers
Authors: Poulopoulos, P Angelakeris, M Kehagias, T Niarchos, D Flevaris, NK
Citation: P. Poulopoulos et al., Improved growth and perpendicular anisotropy in Pd-Co multilayers with intentionally alloyed layers, THIN SOL FI, 371(1-2), 2000, pp. 225-230
Growth of fcc Co in sputter-deposited Co/Au multilayers with (111) texture
Authors: Kehagias, T Komninou, P Christides, C Nouet, G Stavroyiannis, S Karakostas, T
Citation: T. Kehagias et al., Growth of fcc Co in sputter-deposited Co/Au multilayers with (111) texture, J CRYST GR, 208(1-4), 2000, pp. 401-408
A comparative study of composition, structure and elastic properties of boron nitride films deposited by magnetron and ion beam sputtering
Authors: Logothetidis, S Charitidis, C Patsalas, P Kehagias, T
Citation: S. Logothetidis et al., A comparative study of composition, structure and elastic properties of boron nitride films deposited by magnetron and ion beam sputtering, DIAM RELAT, 8(2-5), 1999, pp. 410-414
HREM study of ultra-thin, amorphous carbon films and structural changes ofcarbon forms to diamond under ion bombardment
Authors: Komninou, P Nouet, G Kehagias, T Logothetidis, S Gioti, M Karakostas, T
Citation: P. Komninou et al., HREM study of ultra-thin, amorphous carbon films and structural changes ofcarbon forms to diamond under ion bombardment, DIAM RELAT, 8(2-5), 1999, pp. 688-692
The microstructure of Ti/Al and TiN ohmic contacts to gallium nitride
Authors: Ruterana, P Nouet, G Kehagias, T Komninou, P Karakostas, T Poisson, MAD Huet, F Morkoc, H
Citation: P. Ruterana et al., The microstructure of Ti/Al and TiN ohmic contacts to gallium nitride, PHYS ST S-A, 176(1), 1999, pp. 767-771
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