Citation: O. Fortagne et al., Proceedings of the 26th International Conference on Micro- and Nano-Engineering - September 18-21, 2000 - Jena, Germany - Preface, MICROEL ENG, 57-8, 2001, pp. 1-1
Authors:
Raible, S
Pfeiffer, J
Weiss, T
Clauss, W
Goepel, W
Schurig, V
Kern, DP
Citation: S. Raible et al., Scanning tunneling microscopy on self-assembled calix[4]resorcinarene monolayer adsorbates on Au(111), APPL PHYS A, 70(6), 2000, pp. 607-611
Authors:
Single, C
Augke, R
Prins, EE
Wharam, DA
Kern, DP
Citation: C. Single et al., Towards quantum cellular automata operation in silicon: transport properties of silicon multiple dot structures, SUPERLATT M, 28(5-6), 2000, pp. 429-434
Authors:
Fresser, HS
Frey, H
Prins, FE
Wharam, DA
Kern, DP
Bottcher, J
Kunzel, H
Citation: Hs. Fresser et al., Independent magnetotransport in parallel InGaAs double quantum wells with strongly different properties, SEMIC SCI T, 15(3), 2000, pp. 242-246
Authors:
Kim, BH
Maute, M
Prins, FE
Kern, DP
Croitoru, M
Raible, S
Weimar, U
Gopel, W
Citation: Bh. Kim et al., Parallel frequency readout of an array of mass-sensitive transducers for sensor applications, MICROEL ENG, 53(1-4), 2000, pp. 229-232
Authors:
Heidemeyer, H
Single, C
Zhou, F
Prins, FE
Kern, DP
Plies, E
Citation: H. Heidemeyer et al., Self-limiting and pattern dependent oxidation of silicon dots fabricated on silicon-on-insulator material, J APPL PHYS, 87(9), 2000, pp. 4580-4585
Authors:
Hirai, A
Takemoto, K
Nishino, K
Niemann, B
Hettwer, M
Rudolph, D
Anderson, E
Attwood, D
Kern, DP
Nakayama, Y
Kihara, H
Citation: A. Hirai et al., Transmission x-ray microscopy with 50 nm resolution installed at Ritsumeikan Synchrotron Radiation Center, JPN J A P 1, 38(1A), 1999, pp. 274-278
Citation: G. Bertsche et al., Modification of YBa2Cu3O7-delta wires using a scanning tunneling microscope: Process and electrical transport effects, J VAC SCI B, 16(6), 1998, pp. 3883-3886
Authors:
Single, C
Zhou, F
Heidemeyer, H
Prins, FE
Kern, DP
Plies, E
Citation: C. Single et al., Oxidation properties of silicon dots on silicon oxide investigated using energy filtering transmission electron microscopy, J VAC SCI B, 16(6), 1998, pp. 3938-3942
Citation: J. Scheuring et al., Self-optimizing and adaptive digital signal processor based algorithms in scanning tunneling microscopy, REV SCI INS, 69(12), 1998, pp. 4191-4194