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Results: 1-12 |
Results: 12

Authors: Pi, UH Kye, JI Shin, S Khim, ZG Hong, JW Yoon, S
Citation: Uh. Pi et al., Electrostatic force microscopy with a self-sensing piezoresistive cantilever, J KOR PHYS, 39(2), 2001, pp. 209-212

Authors: Park, WK Khim, ZG
Citation: Wk. Park et Zg. Khim, Effects of interlayer coupling on the dynamic ordering of vortices in high-T-c YBa2CU3O7-delta/PrBa2CU3O7-delta superlattices, PHYS REV B, 61(2), 2000, pp. 1530-1537

Authors: Shin, S Kye, JI Pi, UH Khim, ZG Hong, JW Park, SI Yoon, S
Citation: S. Shin et al., Effect of photoenhanced minority carriers in metal-oxide-semiconductor capacitor studied by scanning capacitance microscopy, J VAC SCI B, 18(6), 2000, pp. 2664-2668

Authors: Lee, JH Chong, Y Lee, S Khim, ZG
Citation: Jh. Lee et al., Josephson vortex dynamics in Bi2Sr2CaCu2O8+delta intrinsic Josephson junctions under high magnetic field, PHYSICA C, 341, 2000, pp. 1079-1080

Authors: Kim, HC Park, JG Lee, SY Lee, S Ri, HC Khim, ZG McEwen, KA
Citation: Hc. Kim et al., Pressure dependent resistivity of (U0.45Y0.55)Pd-3, PHYSICA B, 281, 2000, pp. 397-399

Authors: Park, SJ Kim, S Lee, S Khim, ZG Char, K Hyeon, T
Citation: Sj. Park et al., Synthesis and magnetic studies of uniform iron nanorods and nanospheres, J AM CHEM S, 122(35), 2000, pp. 8581-8582

Authors: Kim, HC Park, JG Hauser, R Bauer, E Khim, ZG
Citation: Hc. Kim et al., Pressure-dependent resistivity studies of (Ce1-xUx)Al-2, J PHYS-COND, 11(36), 1999, pp. 6867-6875

Authors: Kim, DW Kim, DH Kang, BS Noh, TW Shin, S Khim, ZG
Citation: Dw. Kim et al., Atomic control of homoepitaxial SrTiO3 films using laser molecular beam epitaxy, PHYSICA C, 313(3-4), 1999, pp. 246-254

Authors: Hong, JW Park, SI Khim, ZG
Citation: Jw. Hong et al., Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope, REV SCI INS, 70(3), 1999, pp. 1735-1739

Authors: Hong, J Park, SI Nho, K Kwun, SI Khim, ZG
Citation: J. Hong et al., Observation of domain dynamics and nanoscale control of domains in ferroelectric materials with scanning probe microscope, FERROELECTR, 229(1-4), 1999, pp. 131-140

Authors: Hong, JW Shin, SM Kang, CJ Kuk, Y Khim, ZG Park, SI
Citation: Jw. Hong et al., Local charge trapping and detection of trapped charge by scanning capacitance microscope in the SiO2/Si system, APPL PHYS L, 75(12), 1999, pp. 1760-1762

Authors: Hong, JW Kahng, DS Shin, JC Kim, HJ Khim, ZG
Citation: Jw. Hong et al., Detection and control of ferroelectric domains by an electrostatic force microscope, J VAC SCI B, 16(6), 1998, pp. 2942-2946
Risultati: 1-12 |