Citation: Wk. Park et Zg. Khim, Effects of interlayer coupling on the dynamic ordering of vortices in high-T-c YBa2CU3O7-delta/PrBa2CU3O7-delta superlattices, PHYS REV B, 61(2), 2000, pp. 1530-1537
Authors:
Shin, S
Kye, JI
Pi, UH
Khim, ZG
Hong, JW
Park, SI
Yoon, S
Citation: S. Shin et al., Effect of photoenhanced minority carriers in metal-oxide-semiconductor capacitor studied by scanning capacitance microscopy, J VAC SCI B, 18(6), 2000, pp. 2664-2668
Citation: Jh. Lee et al., Josephson vortex dynamics in Bi2Sr2CaCu2O8+delta intrinsic Josephson junctions under high magnetic field, PHYSICA C, 341, 2000, pp. 1079-1080
Citation: Jw. Hong et al., Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope, REV SCI INS, 70(3), 1999, pp. 1735-1739
Authors:
Hong, J
Park, SI
Nho, K
Kwun, SI
Khim, ZG
Citation: J. Hong et al., Observation of domain dynamics and nanoscale control of domains in ferroelectric materials with scanning probe microscope, FERROELECTR, 229(1-4), 1999, pp. 131-140
Authors:
Hong, JW
Shin, SM
Kang, CJ
Kuk, Y
Khim, ZG
Park, SI
Citation: Jw. Hong et al., Local charge trapping and detection of trapped charge by scanning capacitance microscope in the SiO2/Si system, APPL PHYS L, 75(12), 1999, pp. 1760-1762
Citation: Jw. Hong et al., Detection and control of ferroelectric domains by an electrostatic force microscope, J VAC SCI B, 16(6), 1998, pp. 2942-2946