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Authors: Pomozov, YV Sosnin, MG Khirunenko, LI Yashnik, VI Abrosimov, NV Schroder, W Hohne, M

Citation: Yv. Pomozov et al., Oxygen-containing radiation defects in Si1-xGex, SEMICONDUCT, 34(9), 2000, pp. 989-993

Authors: Pomozov, YV Sosnin, MG Khirunenko, LI Yashnik, VI

Citation: Yv. Pomozov et al., Specific features of the behavior of oxygen in Sn-doped silicon, SEMICONDUCT, 34(9), 2000, pp. 994-997

Authors: Khirunenko, LI Pomozov, YV Sosnin, MG Abrosimov, NV Hohne, M Shroder, W

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Authors: Khirunenko, LI Pomozov, YV Sosnin, MG Shinkarenko, VK

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Authors: Lassmann, K Linsenmaier, C Maier, F Zeller, F Haller, EE Itoh, KM Khirunenko, LI Pajot, B Mussig, H

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