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Results: 1-14 |
Results: 14

Authors: Grillo, SE Hellgren, N Serin, V Broitman, E Colliex, C Hultman, L Kihn, Y
Citation: Se. Grillo et al., Monitoring the structural and chemical properties of CNx thin films duringin situ annealing in a TEM, EPJ-APPL PH, 13(2), 2001, pp. 97-105

Authors: Serp, P Feurer, R Kihn, Y Kalck, P Faria, JL Figueiredo, JL
Citation: P. Serp et al., Novel carbon supported material: highly dispersed platinum particles on carbon nanospheres, J MAT CHEM, 11(8), 2001, pp. 1980-1981

Authors: Serp, P Feurer, R Kalck, P Kihn, Y Faria, JL Figueiredo, JL
Citation: P. Serp et al., A chemical vapour deposition process for the production of carbon nanospheres, CARBON, 39(4), 2001, pp. 621-626

Authors: Marangoni, R Serp, P Feurer, R Kihn, Y Kalck, P Vahlas, C
Citation: R. Marangoni et al., Carbon nanotubes produced by substrate free metalorganic chemical vapor deposition of iron catalysts and ethylene, CARBON, 39(3), 2001, pp. 443-449

Authors: Revel, R Bazin, D Elkaim, E Kihn, Y Dexpert, H
Citation: R. Revel et al., An in situ study using anomalous wide-angle X-ray scattering and X-ray absorption spectroscopy of the catalytic system ZnAl2O4 supported on alumina, J PHYS CH B, 104(42), 2000, pp. 9828-9835

Authors: Revel, R Bazin, D Gailhanou, M Lefevre, S Kihn, Y Massiot, D
Citation: R. Revel et al., Complementary aspects of X-ray absorption spectroscopy and anomalous diffraction in the case of light-oxide-supported nanomaterials, J PHYS IV, 10(P10), 2000, pp. 289-297

Authors: Bonafos, C Garrido, B Lopez, M Perez-Rodriguez, A Morante, JR Kihn, Y Ben Assayag, G Claverie, A
Citation: C. Bonafos et al., Ostwald ripening of Ge precipitates elaborated by ion implantation in SiO2, MAT SCI E B, 69, 2000, pp. 380-385

Authors: Kihn, Y Thompson, GE Galaup, G Skeldon, P Zhou, X Shimizu, K Habazaki, H
Citation: Y. Kihn et al., Morphology, composition and structure of anodic films on Al-Cr alloys, CORROS SCI, 42(3), 2000, pp. 533-544

Authors: Serin, V Brydson, R Scott, A Kihn, Y Abidate, O Maquin, B Derre, A
Citation: V. Serin et al., Evidence for the solubility of boron in graphite by electron energy loss spectroscopy, CARBON, 38(4), 2000, pp. 547-554

Authors: Bonafos, C Garrido, B Lopez, M Perez-Rodriguez, A Morante, JR Kihn, Y Ben Assayag, G Claverie, A
Citation: C. Bonafos et al., An electron microscopy study of the growth of Ge nanoparticles in SiO2, APPL PHYS L, 76(26), 2000, pp. 3962-3964

Authors: Moliton, JP Jussiaux-Devilder, C Trigaud, T Lazzaroni, R Bredas, JL Galaup, S Kihn, Y Sevely, J
Citation: Jp. Moliton et al., Plasmons as the primary mechanism of ion-induced modifications in polymers, PHIL MAG B, 79(5), 1999, pp. 793-815

Authors: Galaup, S Kihn, Y
Citation: S. Galaup et Y. Kihn, Elastic-filtered electron diffraction for structure determination of AlN specimen, J ELEC MICR, 48(1), 1999, pp. 17-25

Authors: Serp, P Hierso, JC Feurer, R Kihn, Y Kalck, P Faria, JL Aksoylu, AE Pacheco, AMT Figueiredo, JL
Citation: P. Serp et al., Single-step preparation of activated carbon supported platinum catalysts by fluidized bed organometallic chemical vapor deposition, CARBON, 37(3), 1999, pp. 527-530

Authors: Galaup, S Kihn, Y
Citation: S. Galaup et Y. Kihn, Improvements in the treatment of elastic electron diffraction profiles forlocal order determination in polycrystalline samples, EPJ-APPL PH, 4(3), 1998, pp. 281-290
Risultati: 1-14 |