Authors:
Gagaoudakis, E
Bender, M
Douloufakis, E
Katsarakis, N
Natsakou, E
Cimalla, V
Kiriakidis, G
Citation: E. Gagaoudakis et al., The influence of deposition parameters on room temperature ozone sensing properties of InOx films, SENS ACTU-B, 80(2), 2001, pp. 155-161
Authors:
Kiriakidis, G
Bender, M
Katsarakis, N
Gagaoudakis, E
Hourdakis, E
Douloufakis, E
Cimalla, V
Citation: G. Kiriakidis et al., Ozone sensing properties of polycrystalline indium oxide films at room temperature, PHYS ST S-A, 185(1), 2001, pp. 27-32
Authors:
Bender, M
Katsarakis, N
Gagaoudakis, E
Hourdakis, E
Douloufakis, E
Cimalla, V
Kiriakidis, G
Citation: M. Bender et al., Dependence of the photoreduction and oxidation behavior of indium oxide films on substrate temperature and film thickness, J APPL PHYS, 90(10), 2001, pp. 5382-5387
Authors:
Pissadakis, S
Reekie, L
Zervas, MN
Wilkinson, JS
Kiriakidis, G
Citation: S. Pissadakis et al., Gratings in indium oxide film overlayers on ion-exchanged waveguides by excimer laser micromachining, APPL PHYS L, 78(6), 2001, pp. 694-696
Authors:
Kiriakidis, G
Moschovis, K
Uusimaa, P
Salokatve, A
Pessa, M
Stoemenos, J
Citation: G. Kiriakidis et al., Structural characterization of molecular beam epitaxy grown ZnSe-based layers on GaAs substrates for blue-green laser diodes, THIN SOL FI, 360(1-2), 2000, pp. 195-204
Authors:
Pissadakis, S
Mailis, S
Reekie, L
Wilkinson, JS
Eason, RW
Vainos, NA
Moschovis, K
Kiriakidis, G
Citation: S. Pissadakis et al., Permanent holographic recording in indium oxide thin films using 193 nm excimer laser radiation, APPL PHYS A, 69(3), 1999, pp. 333-336
Authors:
Xirouchaki, C
Moschovis, K
Chatzitheodoridis, E
Kiriakidis, G
Boye, H
Morgen, P
Citation: C. Xirouchaki et al., Structural and chemical characterization of As-deposited microcrystalline indium oxide films prepared by dc reactive magnetron sputtering, J ELEC MAT, 28(1), 1999, pp. 26-34