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Results:
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Results: 2
Clock buffer circuit soft errors in antifuse-based field programmable gatearrays
Authors:
Wang, JJ Katz, RB Dhaoui, F McCollum, JL Wong, W Cronquist, BE Lambertson, RT Hamdy, E Kleyner, I Parker, W
Citation:
Jj. Wang et al., Clock buffer circuit soft errors in antifuse-based field programmable gatearrays, IEEE NUCL S, 47(6), 2000, pp. 2675-2681
The effects of architecture and process on the hardness of programmable technologies
Authors:
Katz, R Wang, JJ Reed, R Kleyner, I D'Ordine, M McCollum, J Cronquist, B Howard, J
Citation:
R. Katz et al., The effects of architecture and process on the hardness of programmable technologies, IEEE NUCL S, 46(6), 1999, pp. 1736-1743
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