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Meisen, P
Schaudel, F
Koidl, P
Vescan, A
Leier, H
Citation: M. Seelmann-eggebert et al., Heat-spreading diamond films for GaN-based high-power transistor devices, DIAM RELAT, 10(3-7), 2001, pp. 744-749
Authors:
Kono, S
Goto, T
Abukawa, T
Wild, C
Koidl, P
Kawarada, H
Citation: S. Kono et al., Surface order evaluation of the heteroepitaxial diamond film grown on an inclined beta-SiC(001), JPN J A P 1, 39(7B), 2000, pp. 4372-4373
Authors:
Steeds, JW
Gilmore, A
Bussmann, KM
Butler, JE
Koidl, P
Citation: Jw. Steeds et al., On the nature of grain boundary defects in high quality CVD diamond films and their influence on physical properties, DIAM RELAT, 8(6), 1999, pp. 996-1005
Authors:
Schneider, H
Schonbein, C
Walther, M
Koidl, P
Weimann, G
Citation: H. Schneider et al., Influence of optical interference on quantum well infrared photodetectors in a 45 degrees waveguide geometry, APPL PHYS L, 74(1), 1999, pp. 16-18
Authors:
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Altmann, H
Balzaretti, NM
Campbell, R
Chae, HB
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Enck, R
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Gu, YQ
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Hartnett, TM
Imhof, RE
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Koidl, P
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Maillet, D
Remy, B
Roger, JP
Seong, DJ
Tye, RP
Verhoeven, H
Worner, E
Yehoda, JE
Zachai, R
Zhang, B
Citation: Je. Graebner et al., Report on a second round robin measurement of the thermal conductivity of CVD diamond, DIAM RELAT, 7(11-12), 1998, pp. 1589-1604