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Results: 1-11 |
Results: 11

Authors: Geromiller, HP Kost, A
Citation: Hp. Geromiller et A. Kost, Numerical calculation of non-TEM-wave field patterns in Crawford-cells, EPJ-APPL PH, 14(3), 2001, pp. 193-197

Authors: Geromiller, HP Kost, A
Citation: Hp. Geromiller et A. Kost, Numerically calculated field homogeneity in TEM-cells, COMPEL, 19(2), 2000, pp. 268-272

Authors: Barbarics, T Kost, A Lederer, D Kis, P
Citation: T. Barbarics et al., Electromagnetic field calculation for magnetic shielding with ferromagnetic material, IEEE MAGNET, 36(4), 2000, pp. 986-989

Authors: Igarashi, H Honma, T Kost, A
Citation: H. Igarashi et al., Inverse inference of magnetization distribution in cylindrical permanent magnets, IEEE MAGNET, 36(4), 2000, pp. 1168-1171

Authors: Righi, LA Koltermann, PI Sadowski, N Bastos, JPA Carlson, R Kost, A Janicke, L Lederer, D
Citation: La. Righi et al., Non-linear magnetic field analysis by FEM using langevin function, IEEE MAGNET, 36(4), 2000, pp. 1263-1266

Authors: Janicke, L Kost, A Bastos, JPA
Citation: L. Janicke et al., Local error distribution in adaptively generated meshes, IEEE MAGNET, 36(4), 2000, pp. 1627-1630

Authors: Lederer, D Igarashi, H Kost, A Honma, T
Citation: D. Lederer et al., Effective reluctivity calculation versus time step calculation of magneticshielding with ferromagnetic material, COMPEL, 18(3), 1999, pp. 410-421

Authors: Kost, A
Citation: A. Kost, Resonant optical nonlinearities in semiconductors, SEM SEMIMET, 58, 1999, pp. 1-53

Authors: Lederer, D Igarashi, H Kost, A Honma, T
Citation: D. Lederer et al., On the parameter identification and application of the Jiles-Atherton hysteresis model for numerical modelling of measured characteristics, IEEE MAGNET, 35(3), 1999, pp. 1211-1214

Authors: Janicke, L Kost, A
Citation: L. Janicke et A. Kost, Convergence properties of the finite element solution, IEEE MAGNET, 35(3), 1999, pp. 1414-1417

Authors: Igarashi, H Kost, A Honma, T
Citation: H. Igarashi et al., A boundary element analysis of magnetic shielding for electron microscopes, COMPEL, 17(5-6), 1998, pp. 585-594
Risultati: 1-11 |