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Results: 1-10 |
Results: 10

Authors: Kraft, O Volkert, CA
Citation: O. Kraft et Ca. Volkert, Mechanical testing of thin films and small structures, ADV ENG MAT, 3(3), 2001, pp. 99-110

Authors: Vogel, M Kraft, O Dehm, G Arzt, E
Citation: M. Vogel et al., Quasi-crystalline grain-boundary phase in the magnesium die-cast alloy ZA85, SCR MATER, 45(5), 2001, pp. 517-524

Authors: Hommel, M Kraft, O
Citation: M. Hommel et O. Kraft, Deformation behavior of thin copper films on deformable substrates, ACT MATER, 49(19), 2001, pp. 3935-3947

Authors: Arzt, E Dehm, G Gumbsch, P Kraft, O Weiss, D
Citation: E. Arzt et al., Interface controlled plasticity in metals: dispersion hardening and thin film deformation, PROG MAT SC, 46(3-4), 2001, pp. 283-307

Authors: Kraft, O Saxa, D Haag, M Wanner, A
Citation: O. Kraft et al., The effect of temperature and strain rate on the hardness of Al and Al-based foams as measured by nanoindentation, Z METALLKUN, 92(9), 2001, pp. 1068-1073

Authors: Kraft, O Hommel, M Arzt, E
Citation: O. Kraft et al., X-ray diffraction as a tool to study the mechanical behaviour of thin films, MAT SCI E A, 288(2), 2000, pp. 209-216

Authors: Holloway, BC Kraft, O Shuh, DK Nix, WD Kelly, M Pianetta, P Hagstrom, S
Citation: Bc. Holloway et al., Role of delocalized nitrogen in determining the local atomic arrangement and mechanical properties of amorphous carbon nitride thin films, J VAC SCI A, 18(6), 2000, pp. 2964-2971

Authors: Schwaiger, R Kraft, O
Citation: R. Schwaiger et O. Kraft, High cycle fatigue of thin silver films investigated by dynamic microbeam deflection, SCR MATER, 41(8), 1999, pp. 823-829

Authors: Hommel, M Kraft, O Arzt, E
Citation: M. Hommel et al., A new method to study cyclic deformation of thin films in tension and compression, J MATER RES, 14(6), 1999, pp. 2373-2376

Authors: Holloway, BC Kraft, O Shuh, DK Kelly, MA Nix, WD Pianetta, P Hagstrom, S
Citation: Bc. Holloway et al., Interpretation of x-ray photoelectron spectra of elastic amorphous carbon nitride thin films, APPL PHYS L, 74(22), 1999, pp. 3290-3292
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