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Results:
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Results: 11
Reliability optimization design using a hybridized genetic algorithm with a neural-network technique
Authors:
Lee, C
Gen, M
Kuo, W
Citation: C. Lee et al., Reliability optimization design using a hybridized genetic algorithm with a neural-network technique, IEICE T FUN, E84A(2), 2001, pp. 627-637
Authors:
Prasad, VR
Kuo, W
Kim, KO
Citation: Vr. Prasad et al., Maximization of a percentile life of a series system through component redundancy allocation, IIE TRANS, 33(12), 2001, pp. 1071-1079
Authors:
Kuo, W
Chen, CD
Citation: W. Kuo et Cd. Chen, Scaling analysis of magnetic-field-limed phase transitions in one-dimensional Josephson junction arrays - art. no. 186804, PHYS REV L, 8718(18), 2001, pp. 6804
Authors:
Rupe, J
Kuo, W
Citation: J. Rupe et W. Kuo, Performability of FMS based on stochastic process models, INT J PROD, 39(1), 2001, pp. 139-155
Authors:
Prasad, VR
Kuo, W
Citation: Vr. Prasad et W. Kuo, Reliability optimization of coherent systems, IEEE RELIAB, 49(3), 2000, pp. 323-330
Authors:
Kuo, W
Prasad, VR
Citation: W. Kuo et Vr. Prasad, An annotated overview of system-reliability optimization, IEEE RELIAB, 49(2), 2000, pp. 176-187
Authors:
Kim, T
Kuo, W
Citation: T. Kim et W. Kuo, Modeling manufacturing yield and reliability, IEEE SEMIC, 12(4), 1999, pp. 485-492
Authors:
Lin, FH
Kuo, W
Hwang, F
Citation: Fh. Lin et al., Structure importance of consecutive-k-out-of-n systems, OPER RES L, 25(2), 1999, pp. 101-107
Authors:
Prasad, VR
Kuo, W
Kim, KMO
Citation: Vr. Prasad et al., Optimal allocation of s-identical, multi-functional spares in a series system, IEEE RELIAB, 48(2), 1999, pp. 118-126
Authors:
Kuo, W
Kim, T
Citation: W. Kuo et T. Kim, An overview of manufacturing yield and reliability modeling for semiconductor products, P IEEE, 87(8), 1999, pp. 1329-1344
Authors:
Kim, T
Kuo, W
Citation: T. Kim et W. Kuo, Optimal burn-in decision making, QUAL REL EN, 14(6), 1998, pp. 417-423
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