Authors: Park, WK Lee, HJ Kye, JI Yun, JH Lee, SM Moon, SH Oh, B

Citation: Wk. Park et al., Effect of ion beam damage and heat treatment on interface-modified junctions, IEEE APPL S, 11(1), 2001, pp. 147-150

Authors: Pi, UH Kye, JI Shin, S Khim, ZG Hong, JW Yoon, S

Citation: Uh. Pi et al., Electrostatic force microscopy with a self-sensing piezoresistive cantilever, J KOR PHYS, 39(2), 2001, pp. 209-212

Authors: Moon, SH Yun, JH Lee, HN Kye, JI Kim, HG Chung, W Oh, B

Citation: Sh. Moon et al., High critical current densities in superconducting MgB2 thin films, APPL PHYS L, 79(15), 2001, pp. 2429-2431

Authors: Shin, S Kye, JI Pi, UH Khim, ZG Hong, JW Park, SI Yoon, S

Citation: S. Shin et al., Effect of photoenhanced minority carriers in metal-oxide-semiconductor capacitor studied by scanning capacitance microscopy, J VAC SCI B, 18(6), 2000, pp. 2664-2668