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Results: 1-22 |
Results: 22
X-ray studies of nanoporous carbon powders produced from silicon carbide
Authors: Smorgonskaya, EA Kyutt, RN Shchukarev, AV Gordeev, SK Grechinskaya, AV
Citation: Ea. Smorgonskaya et al., X-ray studies of nanoporous carbon powders produced from silicon carbide, SEMICONDUCT, 35(6), 2001, pp. 661-665
Defect structure of erbium-doped < 111 > silicon layers formed by solid phase epitaxy
Authors: Kyutt, RN Sobolev, NA Nikolaev, YA Vdovin, VI
Citation: Rn. Kyutt et al., Defect structure of erbium-doped < 111 > silicon layers formed by solid phase epitaxy, NUCL INST B, 173(3), 2001, pp. 319-325
Direct assessment of relaxation and defect propagation in different as-grown and in situ post-growth annealed thin Ge/Si and step-graded Si1-xGex/Si buffer layers
Authors: Yousif, MYA Nur, O Willander, M Patel, CJ Hernandez, C Campidelli, Y Bensahel, D Kyutt, RN
Citation: Mya. Yousif et al., Direct assessment of relaxation and defect propagation in different as-grown and in situ post-growth annealed thin Ge/Si and step-graded Si1-xGex/Si buffer layers, SOL ST ELEC, 45(11), 2001, pp. 1869-1874
Determination of microdistortion components and their application to structural characterization of HVBE GaN epitaxial layers
Authors: Ratnikov, VV Kyutt, RN Shubina, TV Paskova, T Monemar, B
Citation: Vv. Ratnikov et al., Determination of microdistortion components and their application to structural characterization of HVBE GaN epitaxial layers, J PHYS D, 34(10A), 2001, pp. A30-A34
On fractal nature of the structure of nanoporous carbon obtained from carbides
Authors: Smorgonskaya, EA Kyutt, RN Gordeev, SK Grechinskaya, AV Kukushkina, YA Danishevskii, AM
Citation: Ea. Smorgonskaya et al., On fractal nature of the structure of nanoporous carbon obtained from carbides, PHYS SOL ST, 42(6), 2000, pp. 1176-1181
X-ray measurement of a microdistortion tensor and its application in an analysis of the dislocation structure of thick GaN layers obtained by hydrochloride gaseous-phase epitaxy
Authors: Ratnikov, VV Kyutt, RN Shubina, TV
Citation: Vv. Ratnikov et al., X-ray measurement of a microdistortion tensor and its application in an analysis of the dislocation structure of thick GaN layers obtained by hydrochloride gaseous-phase epitaxy, PHYS SOL ST, 42(12), 2000, pp. 2204-2210
Internal microstrain and distribution of composition and cathodoluminescence over lapped Al(x)Ga(1-x)Nepilayers on sapphire
Authors: Usikov, AS Tret'yakov, VV Bobyl', AV Kyutt, RN Lundin, WV Pushnyi, BV Shmidt, NM
Citation: As. Usikov et al., Internal microstrain and distribution of composition and cathodoluminescence over lapped Al(x)Ga(1-x)Nepilayers on sapphire, SEMICONDUCT, 34(11), 2000, pp. 1248-1254
Light-emitting structures based on single crystal silicon doped with erbium, holmium and ytterbium: structural, electrical and optical properties
Authors: Sobolev, NA Emel'yanov, AM Kyutt, RN Nikolaev, YA Shek, EI Aleksandrov, OV Zachar'in, AO Vdovin, VI Makoviichuk, MI Parshin, EO Yakimenko, AN
Citation: Na. Sobolev et al., Light-emitting structures based on single crystal silicon doped with erbium, holmium and ytterbium: structural, electrical and optical properties, IAN FIZ, 64(2), 2000, pp. 258-263
Characterization of strain relaxation in low-defect-density thin single and step-graded germanium buffer layers by high-resolution two-dimensional x-ray diffraction mapping
Authors: Nur, O Karlsteen, M Sodervall, U Willander, M Patel, CJ Hernandez, C Campidelli, Y Bensahel, D Kyutt, RN
Citation: O. Nur et al., Characterization of strain relaxation in low-defect-density thin single and step-graded germanium buffer layers by high-resolution two-dimensional x-ray diffraction mapping, SEMIC SCI T, 15(7), 2000, pp. L25-L30
Excitons as a probe of interface morphology in Cd(Zn) Se/ZnSe heterostructures
Authors: Toropov, AA Shubina, TV Sorokin, SV Kyutt, RN Ivanov, SV Pozina, GR Bergman, JP Monemar, B Karlsteen, M Willander, M
Citation: Aa. Toropov et al., Excitons as a probe of interface morphology in Cd(Zn) Se/ZnSe heterostructures, APPL SURF S, 166(1-4), 2000, pp. 278-283
Spatial distribution of Cd in CdSe/ZnSe superlattices studied by X-ray diffraction
Authors: Kyutt, RN Toropov, AA Shubina, TV Sorokin, SV Ivanov, SV Karlsteen, M Willander, M
Citation: Rn. Kyutt et al., Spatial distribution of Cd in CdSe/ZnSe superlattices studied by X-ray diffraction, APPL SURF S, 166(1-4), 2000, pp. 341-345
Excitonic spectrum in CdSe/ZnSe disordered superlattices
Authors: Toropov, AA Shubina, TV Kyutt, RN Sorokin, SV Ivanov, SV Fedorov, DL Karlsteen, M Willander, M
Citation: Aa. Toropov et al., Excitonic spectrum in CdSe/ZnSe disordered superlattices, PHYS ST S-A, 178(1), 2000, pp. 203-210
Structural study of nanoporous carbon produced from polycrystalline carbide materials: small-angle x-ray scattering
Authors: Kyutt, RN Smorgonskaya, EA Danishevskii, AM Gordeev, SK Grechinskaya, AV
Citation: Rn. Kyutt et al., Structural study of nanoporous carbon produced from polycrystalline carbide materials: small-angle x-ray scattering, PHYS SOL ST, 41(8), 1999, pp. 1359-1363
Structural studies of nanoporous carbon produced from silicon carbide
Authors: Kyutt, RN Smorgonskaya, EA Danishevski, AM Gordeev, SK Grechinskaya, AV
Citation: Rn. Kyutt et al., Structural studies of nanoporous carbon produced from silicon carbide, PHYS SOL ST, 41(5), 1999, pp. 808-810
Structural perfection of GaN epitaxial layers according to x-ray diffraction measurements
Authors: Kyutt, RN Ratnikov, VV Mosina, GN Shcheglov, MP
Citation: Rn. Kyutt et al., Structural perfection of GaN epitaxial layers according to x-ray diffraction measurements, PHYS SOL ST, 41(1), 1999, pp. 25-31
Miniband transport in a semiconductor superlattice with submonolayer barriers
Authors: Schomburg, E Brandl, S Renk, KF Ledentsov, NN Ustinov, VM Zhukov, AE Kovsh, AR Egorov, AY Kyutt, RN Volovik, BV Kop'ev, PS Alferov, ZI Rosenauer, A Litvinov, D Gerthsen, D Pavel'ev, DG Koschurinov, YI
Citation: E. Schomburg et al., Miniband transport in a semiconductor superlattice with submonolayer barriers, PHYS LETT A, 262(4-5), 1999, pp. 396-401
Mosaic structure and Si doping related peculiarities of charge carrier transport in III-V nitrides
Authors: Shmidt, NM Emtsev, VV Kryzhanovsky, AS Kyutt, RN Lundin, WV Poloskin, DS Ratnikov, VV Sakharov, AV Titkov, AN Usikov, AS Girard, P
Citation: Nm. Shmidt et al., Mosaic structure and Si doping related peculiarities of charge carrier transport in III-V nitrides, PHYS ST S-B, 216(1), 1999, pp. 581-586
Intrinsic microstrains and cathodoluminescence in epitaxial GaN films
Authors: Bobyl, AV Kyutt, RN Tretyakov, VV
Citation: Av. Bobyl et al., Intrinsic microstrains and cathodoluminescence in epitaxial GaN films, SEMIC SCI T, 14(6), 1999, pp. 589-594
Broadening of the excitonic mobility edge in a macroscopically disordered CdSe/ZnSe short-period superlattice
Authors: Toropov, AA Shubina, TV Sorokin, SV Lebedev, AV Kyutt, RN Ivanov, SV Karlsteen, M Willander, M Pozina, GR Bergman, JP Monemar, B
Citation: Aa. Toropov et al., Broadening of the excitonic mobility edge in a macroscopically disordered CdSe/ZnSe short-period superlattice, PHYS REV B, 59(4), 1999, pp. R2510-R2513
CdF2-CaF2 superlattices on Si(111): MBE growth, structural and luminescence studies
Authors: Sokolov, NS Gastev, SV Khilko, AY Kyutt, RN Suturin, SM Zamoryanskaya, MV
Citation: Ns. Sokolov et al., CdF2-CaF2 superlattices on Si(111): MBE growth, structural and luminescence studies, J CRYST GR, 202, 1999, pp. 1053-1056
Molecular beam epitaxy and characterization of CdF2 layers on CaF2(111)
Authors: Kaveev, AK Kyutt, RN Moisseeva, MM Schowalter, LJ Shusterman, YV Sokolov, NS Suturin, SM Yakovlev, NL
Citation: Ak. Kaveev et al., Molecular beam epitaxy and characterization of CdF2 layers on CaF2(111), J CRYST GR, 202, 1999, pp. 1105-1108
Broadening of submonolayer CdSe sheets in CdSe ZnSe superlattices studied by x-ray diffraction
Authors: Kyutt, RN Toropov, AA Sorokin, SV Shubina, TV Ivanov, SV Karlsteen, M Willander, M
Citation: Rn. Kyutt et al., Broadening of submonolayer CdSe sheets in CdSe ZnSe superlattices studied by x-ray diffraction, APPL PHYS L, 75(3), 1999, pp. 373-375
Risultati: 1-22 |