Citation: Jr. Lagraff et Jm. Murduck, LOCAL CROSS-SECTIONAL PROFILING OF MULTILAYER THIN-FILMS WITH AN ATOMIC-FORCE MICROSCOPE FOR LAYER THICKNESS DETERMINATION, Journal of materials research, 12(8), 1997, pp. 1935-1938
Authors:
LAGRAFF JR
CHAN H
MURDUCK JM
HONG SH
MA QY
Citation: Jr. Lagraff et al., NOVEL METHOD FOR FABRICATION OF INTEGRATED RESISTORS ON BILAYER AG YBA2CU3O7 FILMS USING NI IMPLANTATION/, Applied physics letters, 71(15), 1997, pp. 2199-2201
Citation: Jr. Lagraff et Aa. Gewirth, IN-SITU OBSERVATION OF OXYGEN ADLAYER FORMATION ON CU(110) ELECTRODE SURFACES, Surface science, 326(3), 1995, pp. 461-466
Citation: Jr. Lagraff et Aa. Gewirth, NANOMETER-SCALE MECHANISM FOR THE CONSTRUCTIVE MODIFICATION OF CU SINGLE-CRYSTALS AND ALKANETHIOL PASSIVATED AU(111) WITH AN ATOMIC-FORCE MICROSCOPE, Journal of physical chemistry, 99(24), 1995, pp. 10009-10018
Citation: Jr. Lagraff et Aa. Gewirth, ENHANCED ELECTROCHEMICAL DEPOSITION WITH AN ATOMIC-FORCE MICROSCOPE, Journal of physical chemistry, 98(44), 1994, pp. 11246-11250