Authors: KOGA R PENZIN SH CRAWFORD KB CRAIN WR MOSS SC PINKERTON SD LALUMONDIERE SD MAHER MC

Citation: R. Koga et al., SINGLE EVENT UPSET (SEU) SENSITIVITY DEPENDENCE OF LINEAR INTEGRATED-CIRCUITS (ICS) ON BIAS CONDITIONS, IEEE transactions on nuclear science, 44(6), 1997, pp. 2325-2332

Authors: VELAZCO R CALIN T NICOLAIDIS M MOSS SC LALUMONDIERE SD TRAN VT KOGA R

Citation: R. Velazco et al., SEU-HARDENED STORAGE CELL VALIDATION USING A PULSED-LASER, IEEE transactions on nuclear science, 43(6), 1996, pp. 2843-2848

Authors: MOSS SC LALUMONDIERE SD SCARPULLA JR MACWILLIAMS KP CRAIN WR KOGA R

Citation: Sc. Moss et al., CORRELATION OF PICOSECOND LASER-INDUCED LATCHUP AND ENERGETIC PARTICLE-INDUCED LATCHUP IN CMOS TEST STRUCTURES, IEEE transactions on nuclear science, 42(6), 1995, pp. 1948-1956