Authors: WALTHER HG LAN TTN

Citation: Hg. Walther et Ttn. Lan, HARDNESS DEPTH PROFILING IN STEEL BY PHOT OTHERMAL TESTING, TM. Technisches Messen, 65(5), 1998, pp. 185-191

Authors: SEIDEL U LAN TTN WALTHER HG SCHMITZ B GEERKENS J GOCH G

Citation: U. Seidel et al., QUANTITATIVE CHARACTERIZATION OF MATERIAL INHOMOGENEITIES BY THERMAL WAVES, Optical engineering, 36(2), 1997, pp. 376-390

Authors: LAN TTN SEIDEL U WALTHER HG KALUS G

Citation: Ttn. Lan et al., RADIOMETRIC DEPTH PROFILING OF THERMAL-PROPERTIES IN METALS, Progress in Natural Science, 6, 1996, pp. 211-214

Authors: LAN TTN WALTHER HG

Citation: Ttn. Lan et Hg. Walther, PHOTOTHERMAL DEPTH PROFILING USING ONLY PHASE DATA, Journal of applied physics, 80(9), 1996, pp. 5289-5291

Authors: LAN TTN SEIDEL U WALTHER HG GOCH G SCHMITZ B

Citation: Ttn. Lan et al., EXPERIMENTAL RESULTS OF PHOTOTHERMAL MICROSTRUCTURAL DEPTH PROFILING, Journal of applied physics, 78(6), 1995, pp. 4108-4111

Authors: LAN TTN SEIDEL U WALTHER HG

Citation: Ttn. Lan et al., THEORY OF MICROSTRUCTURAL DEPTH PROFILING BY PHOTOTHERMAL MEASUREMENTS, Journal of applied physics, 77(9), 1995, pp. 4739-4745