Authors:
LAN TTN
SEIDEL U
WALTHER HG
GOCH G
SCHMITZ B
Citation: Ttn. Lan et al., EXPERIMENTAL RESULTS OF PHOTOTHERMAL MICROSTRUCTURAL DEPTH PROFILING, Journal of applied physics, 78(6), 1995, pp. 4108-4111
Citation: Ttn. Lan et al., THEORY OF MICROSTRUCTURAL DEPTH PROFILING BY PHOTOTHERMAL MEASUREMENTS, Journal of applied physics, 77(9), 1995, pp. 4739-4745