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Authors: LAU WM HUANG LJ CHANG WH BELLO I ABRAHAM T KING M
Citation: Wm. Lau et al., NANOMETER P-N-JUNCTION FORMATION AND CHARACTERIZATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1134-1138

Authors: BELLO I CHANG WH LAU WM
Citation: I. Bello et al., IMPORTANCE OF THE MOLECULAR IDENTITY OF ION SPECIES IN REACTIVE ION ETCHING AT LOW ENERGIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1425-1430

Authors: BRUCE T HUANG LJ BELLO I LAU WM PANCHHI P STRNAD V HIGH M
Citation: T. Bruce et al., INTERFACIAL REACTIONS OF ION-BEAM DEPOSITED AC FILMS ON ZNS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1487-1490

Authors: LANDHEER D LU ZH BARIBEAU JM HUANG LJ LAU WM
Citation: D. Landheer et al., CAPACITANCE-VOLTAGE CHARACTERISTICS OF METAL-INSULATOR-SEMICONDUCTOR DIODES WITH S-PASSIVATION AND SI INTERFACE CONTROL LAYERS ON GAAS AND INP, Journal of electronic materials, 23(9), 1994, pp. 943-952

Authors: HUANG LJ LAU WM TANG HT LENNARD WN MITCHELL IV SCHULTZ PJ KASRAI M
Citation: Lj. Huang et al., NEAR-SURFACE STRUCTURE OF LOW-ENERGY-ARGON-BOMBARDED SI(100), Physical review. B, Condensed matter, 50(24), 1994, pp. 18453-18468

Authors: HUANG LJ LAU WM INGREY S LANDHEER D NOEL JP
Citation: Lj. Huang et al., METAL-INSULATOR-SEMICONDUCTOR CAPACITORS ON CLEAVED GAAS(110), Journal of applied physics, 76(12), 1994, pp. 8192-8194

Authors: HUANG LJ BELO I LAU WM LEE ST STEVENS PA DEVRIES BD
Citation: Lj. Huang et al., SYNCHROTRON-RADIATION X-RAY-ABSORPTION OF ION-BOMBARDMENT INDUCED DEFECTS ON DIAMOND(100), Journal of applied physics, 76(11), 1994, pp. 7483-7486

Authors: BRUCE T BELLO I HUANG LJ LAU WM HIGH M STRNAD V PANCHHI P
Citation: T. Bruce et al., INTERFACIAL CHARACTERIZATION OF ION-BEAM-DEPOSITED AC FILMS ON GE, Journal of applied physics, 76(1), 1994, pp. 552-557

Authors: LAU WM HUANG LJ BELLO I YIU YM LEE ST
Citation: Wm. Lau et al., MODIFICATION OF SURFACE BAND BENDING OF DIAMOND BY LOW-ENERGY ARGON AND CARBON ION-BOMBARDMENT, Journal of applied physics, 75(7), 1994, pp. 3385-3391

Authors: LANDHEER D YOUSEFI GH WEBB JB KWOK RWM LAU WM
Citation: D. Landheer et al., DEEP-LEVEL TRANSIENT SPECTROSCOPY OF HF-CLEANED AND SULFUR-PASSIVATEDINP METAL NITRIDE SEMICONDUCTOR STRUCTURES, Journal of applied physics, 75(7), 1994, pp. 3516-3521

Authors: BELLO I CHANG WH LAU WM
Citation: I. Bello et al., MECHANISM OF CLEANING AND ETCHING SI SURFACES WITH LOW-ENERGY CHLORINE ION-BOMBARDMENT, Journal of applied physics, 75(6), 1994, pp. 3092-3097

Authors: LAU WM BELLO I SAYER M ZOU LC
Citation: Wm. Lau et al., FLUORINE ION ETCHING OF LEAD-ZIRCONATE-TITANATE THIN-FILMS, Applied physics letters, 64(3), 1994, pp. 300-305

Authors: CHANG WH HUANG LJ LAU WM ABRAHAM T KING M
Citation: Wh. Chang et al., STUDY OF REACTIVE-ION-ETCHED SILICON BY A NOVEL ULTRASHALLOW DEPTH PROFILING TECHNIQUE, Applied physics letters, 64(16), 1994, pp. 2154-2156

Authors: HUANG LJ LAU WM
Citation: Lj. Huang et Wm. Lau, MULTIFRACTAL ANALYSIS OF 2-DIMENSIONAL CARBON CLUSTERS, Journal of physics. Condensed matter, 5(38), 1993, pp. 7087-7094

Authors: KWOK RWM LAU WM LANDHEER D INGREY S
Citation: Rwm. Kwok et al., SURFACE-CHARGE SPECTROSCOPY - A NOVEL SURFACE SCIENCE TECHNIQUE FOR MEASURING SURFACE-STATE DISTRIBUTIONS ON SEMICONDUCTORS, Journal of electronic materials, 22(9), 1993, pp. 1141-1146

Authors: LAU WM
Citation: Wm. Lau, PROTECTION BY TACRINE AND SOME ADJUNCTS AGAINST THE DEPRESSANT EFFECTS OF SOMAN IN GUINEA-PIG ATRIUM, General pharmacology, 24(6), 1993, pp. 1513-1519

Authors: BELLO I CHANG WH FENG XH LAU WM
Citation: I. Bello et al., STUDIES OF REACTIVE ION ETCHING USING COLUTRON HOT-FILAMENT DC PLASMAION SOURCES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 1002-1005

Authors: SZILAGYI M LAU WM
Citation: M. Szilagyi et Wm. Lau, INTERACTION OF TACRINE AT M(1) AND M(2) CHOLINOCEPTORS IN GUINEA-PIG BRAIN, Pharmacology, 47(4), 1993, pp. 223-229

Authors: LAU WM BELLO I HUANG LJ FENG X VOS M MITCHELL IV
Citation: Wm. Lau et al., ARGON INCORPORATION IN SI(100) BY ION-BOMBARDMENT AT 15-100 EV, Journal of applied physics, 74(12), 1993, pp. 7101-7106

Authors: LAU WM HUANG LJ CHANG WH VOS M MITCHELL IV
Citation: Wm. Lau et al., ULTRASHALLOW DEPTH PROFILING USING OZONE OXIDATION AND HF ETCHING OF SILICON, Applied physics letters, 63(1), 1993, pp. 78-80

Authors: LANDHEER D BARDWELL JA SPROULE I SCOTTTHOMAS J KWOK W LAU WM
Citation: D. Landheer et al., REDUCED INTERFACE STATE DENSITIES FOR REMOTE MICROWAVE PLASMA SILICON-NITRIDE, Canadian journal of physics, 70(10-11), 1992, pp. 795-798
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