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Citation: R. Leutenecker et al., TITANIUM MONOPHOSPHIDE (TIP) LAYERS AS POTENTIAL DIFFUSION-BARRIERS, Microelectronic engineering, 37-8(1-4), 1997, pp. 397-402

Authors: ALBERTS L LEUTENECKER R WOLF GK

Citation: L. Alberts et al., TEXTURE OF IBAD TIN FILMS AS A FUNCTION OF ION-BEAM INTENSITY AND ANGULAR INCIDENCE, Surface & coatings technology, 84(1-3), 1996, pp. 443-447

Authors: ALBERTS L LEUTENECKER R MOINE P WOLF GK

Citation: L. Alberts et al., ELASTOPLASTIC PROPERTIES OF IBAD TIN FILMS MADE UNDER OFF-NORMAL INCIDENCE, Surface & coatings technology, 84(1-3), 1996, pp. 453-457

Authors: LEUTENECKER R FROSCHLE B CAOMINH U RAMM P

Citation: R. Leutenecker et al., TITANIUM NITRIDE FILMS FOR BARRIER APPLICATIONS PRODUCED BY RAPID THERMAL CVD AND SUBSEQUENT IN-SITU ANNEALING, Thin solid films, 270(1-2), 1995, pp. 621-626

Authors: KRAMER A LEUTENECKER R AUBERTIN F GONSER U

Citation: A. Kramer et al., AMORPHIZATION OF ARMCO IRON BY BORON IMPLANTATION AND SUBSEQUENT CRYSTALLIZATION BY HEAT-TREATMENT - A GEMS, X-RAY AND ULTRAMICROHARDNESS STUDY, Hyperfine interactions, 94(1-4), 1994, pp. 2367-2372