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Results: 1-25 | 26-45 |
Results: 26-45/45
IN-SITU SPECTROSCOPIC ELLIPSOMETRY TO CONTROL THE GROWTH OF TI NITRIDE AND CARBIDE THIN-FILMS
Authors: LOGOTHETIDIS S ALEXANDROU I STOEMENOS J
Citation: S. Logothetidis et al., IN-SITU SPECTROSCOPIC ELLIPSOMETRY TO CONTROL THE GROWTH OF TI NITRIDE AND CARBIDE THIN-FILMS, Applied surface science, 86(1-4), 1995, pp. 185-189
OPTICAL AND ELECTRONIC-STRUCTURE STUDY OF CUBIC AND HEXAGONAL GAN THIN-FILMS
Authors: PETALAS J LOGOTHETIDIS S BOULTADAKIS S ALOUANI M WILLS JM
Citation: J. Petalas et al., OPTICAL AND ELECTRONIC-STRUCTURE STUDY OF CUBIC AND HEXAGONAL GAN THIN-FILMS, Physical review. B, Condensed matter, 52(11), 1995, pp. 8082-8091
CHARACTERIZATION OF ION-BEAM-DEPOSITED DIAMOND-LIKE CARBON-FILMS
Authors: PALSHIN V MELETIS EI VES S LOGOTHETIDIS S
Citation: V. Palshin et al., CHARACTERIZATION OF ION-BEAM-DEPOSITED DIAMOND-LIKE CARBON-FILMS, Thin solid films, 270(1-2), 1995, pp. 165-172
ELECTRON-MICROSCOPY CHARACTERIZATION OF TIN FILMS ON SI, GROWN BY DC-REACTIVE MAGNETRON SPUTTERING
Authors: PECZ B FRANGIS N LOGOTHETIDIS S ALEXANDROU I BARNA PB STOEMENOS J
Citation: B. Pecz et al., ELECTRON-MICROSCOPY CHARACTERIZATION OF TIN FILMS ON SI, GROWN BY DC-REACTIVE MAGNETRON SPUTTERING, Thin solid films, 268(1-2), 1995, pp. 57-63
THE EFFECT OF HYDROGEN AND TEMPERATURE ON THE OPTICAL GAPS OF SILICON-NITRIDE AND COMPARATIVE STOICHIOMETRY STUDIES ON SIN THIN-FILMS
Authors: PETALAS J LOGOTHETIDIS S BOULTADAKIS S MARKWITZ A
Citation: J. Petalas et al., THE EFFECT OF HYDROGEN AND TEMPERATURE ON THE OPTICAL GAPS OF SILICON-NITRIDE AND COMPARATIVE STOICHIOMETRY STUDIES ON SIN THIN-FILMS, Journal of non-crystalline solids, 187, 1995, pp. 291-296
SPECTROSCOPIC ELLIPSOMETRY STUDY OF THE INTERFACIAL STRESSES AND THEIR CORRELATION WITH MICROVOIDS IN VERY THIN THERMALLY GROWN SIO2-FILMS
Authors: LOGOTHETIDIS S BOULTADAKIS S
Citation: S. Logothetidis et S. Boultadakis, SPECTROSCOPIC ELLIPSOMETRY STUDY OF THE INTERFACIAL STRESSES AND THEIR CORRELATION WITH MICROVOIDS IN VERY THIN THERMALLY GROWN SIO2-FILMS, Journal of applied physics, 78(9), 1995, pp. 5362-5365
SPECTROSCOPIC ELLIPSOMETRY STUDIES OF VERY THIN THERMALLY GROWN SIO2-FILMS - INFLUENCE OF OXIDATION PROCEDURE ON OXIDE QUALITY AND STRESS
Authors: BOULTADAKIS S LOGOTHETIDIS S PAPADOPOULOS A VOUROUTZIS N ZORBA P GIRGINOUDI D THANAILAKIS A
Citation: S. Boultadakis et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES OF VERY THIN THERMALLY GROWN SIO2-FILMS - INFLUENCE OF OXIDATION PROCEDURE ON OXIDE QUALITY AND STRESS, Journal of applied physics, 78(6), 1995, pp. 4164-4173
IN-SITU SPECTROSCOPIC ELLIPSOMETRY TO MONITOR THE PROCESS OF TINX THIN-FILMS DEPOSITED BY REACTIVE SPUTTERING
Authors: LOGOTHETIDIS S ALEXANDROU I PAPADOPOULOS A
Citation: S. Logothetidis et al., IN-SITU SPECTROSCOPIC ELLIPSOMETRY TO MONITOR THE PROCESS OF TINX THIN-FILMS DEPOSITED BY REACTIVE SPUTTERING, Journal of applied physics, 77(3), 1995, pp. 1043-1047
STRUCTURE AND OPTICAL-PROPERTIES OF TUNGSTEN THIN-FILMS DEPOSITED BY PYROLYSIS OF W(CO)(6) AT VARIOUS TEMPERATURES
Authors: DAVAZOGLOU D PALLIS G PSYCHARIS V GIOTI M LOGOTHETIDIS S
Citation: D. Davazoglou et al., STRUCTURE AND OPTICAL-PROPERTIES OF TUNGSTEN THIN-FILMS DEPOSITED BY PYROLYSIS OF W(CO)(6) AT VARIOUS TEMPERATURES, Journal of applied physics, 77(11), 1995, pp. 6070-6072
SCHOTTKY-BARRIER CONTACTS OF TITANIUM NITRIDE ON N-TYPE SILICON
Authors: DIMITRIADIS CA LOGOTHETIDIS S ALEXANDROU I
Citation: Ca. Dimitriadis et al., SCHOTTKY-BARRIER CONTACTS OF TITANIUM NITRIDE ON N-TYPE SILICON, Applied physics letters, 66(4), 1995, pp. 502-504
OPTICAL-PROPERTIES AND TEMPERATURE-DEPENDENCE OF THE INTERBAND-TRANSITIONS OF CUBIC AND HEXAGONAL GAN
Authors: LOGOTHETIDIS S PETALAS J CARDONA M MOUSTAKAS TD
Citation: S. Logothetidis et al., OPTICAL-PROPERTIES AND TEMPERATURE-DEPENDENCE OF THE INTERBAND-TRANSITIONS OF CUBIC AND HEXAGONAL GAN, Physical review. B, Condensed matter, 50(24), 1994, pp. 18017-18029
TETRAHEDRON-MODEL ANALYSIS OF SILICON-NITRIDE THIN-FILMS AND THE EFFECT OF HYDROGEN AND TEMPERATURE ON THEIR OPTICAL-PROPERTIES
Authors: PETALAS J LOGOTHETIDIS S
Citation: J. Petalas et S. Logothetidis, TETRAHEDRON-MODEL ANALYSIS OF SILICON-NITRIDE THIN-FILMS AND THE EFFECT OF HYDROGEN AND TEMPERATURE ON THEIR OPTICAL-PROPERTIES, Physical review. B, Condensed matter, 50(16), 1994, pp. 11801-11816
OPTICAL-PROPERTIES OF ALPHA-SIC-H THIN-FILMS GROWN BY RF-SPUTTERING
Authors: KALOMIROS JA PAPADOPOULOS A LOGOTHETIDIS S MAGAFAS L GEORGOULAS N THANAILAKIS A
Citation: Ja. Kalomiros et al., OPTICAL-PROPERTIES OF ALPHA-SIC-H THIN-FILMS GROWN BY RF-SPUTTERING, Physical review. B, Condensed matter, 49(12), 1994, pp. 8191-8197
TITANIUM DISILICIDE ON SILICON BY INTERDIFFUSION OF TITANIUM AND AMORPHOUS-SILICON MULTILAYERS - TRANSMISSION ELECTRON-MICROSCOPY, SPECTROSCOPIC ELLIPSOMETRY AND RESISTIVITY MEASUREMENTS
Authors: NASSIOPOULOS AG TAMBOURIS D FRANGIS N LOGOTHETIDIS S GEORGA S KRONTIRAS C XANTHOPOULOS N
Citation: Ag. Nassiopoulos et al., TITANIUM DISILICIDE ON SILICON BY INTERDIFFUSION OF TITANIUM AND AMORPHOUS-SILICON MULTILAYERS - TRANSMISSION ELECTRON-MICROSCOPY, SPECTROSCOPIC ELLIPSOMETRY AND RESISTIVITY MEASUREMENTS, Thin solid films, 247(1), 1994, pp. 44-50
OPTICAL AND ELECTRONIC-PROPERTIES MODIFICATIONS IN PD-NI MULTILAYERS
Authors: LOGOTHETIDIS S FLEVARIS NK
Citation: S. Logothetidis et Nk. Flevaris, OPTICAL AND ELECTRONIC-PROPERTIES MODIFICATIONS IN PD-NI MULTILAYERS, Journal of applied physics, 75(12), 1994, pp. 7978-7982
CHARACTERIZATION OF SIN THIN-FILMS WITH SPECTROSCOPIC ELLIPSOMETRY
Authors: PETALAS J LOGOTHETIDIS S MARKWITZ A PALOURA EC JOHNSON RL FUCHS D
Citation: J. Petalas et al., CHARACTERIZATION OF SIN THIN-FILMS WITH SPECTROSCOPIC ELLIPSOMETRY, Physica. B, Condensed matter, 185(1-4), 1993, pp. 342-347
INVESTIGATION OF THE ELECTRONIC-TRANSITIONS OF CUBIC SIC
Authors: LOGOTHETIDIS S POLATOGLOU HM PETALAS J FUCHS D JOHNSON RL
Citation: S. Logothetidis et al., INVESTIGATION OF THE ELECTRONIC-TRANSITIONS OF CUBIC SIC, Physica. B, Condensed matter, 185(1-4), 1993, pp. 389-393
ELLIPSOMETRIC AND POLAR KERR SPECTROSCOPIC STUDIES OF PD-NI AND CO-PTMULTILAYERS
Authors: FLEVARIS NK LOGOTHETIDIS S PETALAS J KIELAR P NYVLT M PARIZEK V VISNOVSKY S KRISHNAN R
Citation: Nk. Flevaris et al., ELLIPSOMETRIC AND POLAR KERR SPECTROSCOPIC STUDIES OF PD-NI AND CO-PTMULTILAYERS, Journal of magnetism and magnetic materials, 121(1-3), 1993, pp. 479-482
OPTICAL STUDIES OF CU-NI, PD-NI AND CO-PT MULTILAYERS BY CONVENTIONALAND SYNCHROTRON-RADIATION ELLIPSOMETRY
Authors: LOGOTHETIDIS S PETALAS J FLEVARIS NK JOHNSON RL
Citation: S. Logothetidis et al., OPTICAL STUDIES OF CU-NI, PD-NI AND CO-PT MULTILAYERS BY CONVENTIONALAND SYNCHROTRON-RADIATION ELLIPSOMETRY, Thin solid films, 234(1-2), 1993, pp. 538-541
OPTICAL AND COMPOSITIONAL STUDIES OF SIN THIN-FILMS WITH CONVENTIONALAND SYNCHROTRON-RADIATION ELLIPSOMETRY
Authors: LOGOTHETIDIS S PETALAS J MARKWITZ A JOHNSON RL
Citation: S. Logothetidis et al., OPTICAL AND COMPOSITIONAL STUDIES OF SIN THIN-FILMS WITH CONVENTIONALAND SYNCHROTRON-RADIATION ELLIPSOMETRY, Journal of applied physics, 73(12), 1993, pp. 8514-8518
Risultati: 1-25 | 26-45 |