ACNP - Italian Periodicals Catalogue

AAAAAA

ITA
ENG

Results: 1-12 |

Results: 12

EVIDENCE FOR TILTED CHAINS ON THE DIAMOND(111)-(2X1) SURFACE

Authors: HUISMAN WJ LOHMEIER M VANDERVEGT HA PETERS JF DEVRIES SA VLIEG E ETGENS VH DERRY TE VANDERVEEN JF

Citation: Wj. Huisman et al., EVIDENCE FOR TILTED CHAINS ON THE DIAMOND(111)-(2X1) SURFACE, Surface science, 396(1-3), 1998, pp. 241-252

W-CMP FOR SUBMICRON INVERSE METALLIZATION

Authors: VANKRANENBURG H VANCORBACH HD WOERLEE PH LOHMEIER M

Citation: H. Vankranenburg et al., W-CMP FOR SUBMICRON INVERSE METALLIZATION, Microelectronic engineering, 33(1-4), 1997, pp. 241-248

ATOMIC-STRUCTURE AND THERMAL-STABILITY OF 2-DIMENSIONAL ER SILICIDE ON SI(111)

Authors: LOHMEIER M HUISMAN WJ TERHORST G ZAGWIJN PM VLIEG E NICKLIN CL TURNER TS

Citation: M. Lohmeier et al., ATOMIC-STRUCTURE AND THERMAL-STABILITY OF 2-DIMENSIONAL ER SILICIDE ON SI(111), Physical review. B, Condensed matter, 54(3), 1996, pp. 2004-2009

INTERFACE STRUCTURE OF SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-ERSI2-X

Authors: LOHMEIER M HUISMAN WJ VLIEG E NISHIYAMA A NICKLIN CL TURNER TS

Citation: M. Lohmeier et al., INTERFACE STRUCTURE OF SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-ERSI2-X, Surface science, 345(3), 1996, pp. 247-260

AN OUT-OF-PLANE DETECTOR FOR SURFACE X-RAY-DIFFRACTION

Authors: TAYLOR JSG NORRIS C VLIEG E LOHMEIER M TURNER TS

Citation: Jsg. Taylor et al., AN OUT-OF-PLANE DETECTOR FOR SURFACE X-RAY-DIFFRACTION, Review of scientific instruments, 67(7), 1996, pp. 2658-2659

INCORPORATION AND OPTICAL ACTIVATION OF ERBIUM IN SILICON USING MOLECULAR-BEAM EPITAXY

Authors: SERNA R SHIN JH LOHMEIER M VLIEG E POLMAN A ALKEMADE PFA

Citation: R. Serna et al., INCORPORATION AND OPTICAL ACTIVATION OF ERBIUM IN SILICON USING MOLECULAR-BEAM EPITAXY, Journal of applied physics, 79(5), 1996, pp. 2658-2662

SURFACE X-RAY CRYSTALLOGRAPHY OF GROWING CRYSTALS AND INTERFACES

Authors: VLIEG E LOHMEIER M VANDERVEGT HA

Citation: E. Vlieg et al., SURFACE X-RAY CRYSTALLOGRAPHY OF GROWING CRYSTALS AND INTERFACES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 97(1-4), 1995, pp. 358-363

OXYGEN MODIFIED GROWTH OF GD ON MO(110)

Authors: MOZLEY S NICKLIN CL JAMES MA STEADMAN P NORRIS C LOHMEIER M

Citation: S. Mozley et al., OXYGEN MODIFIED GROWTH OF GD ON MO(110), Surface science, 333, 1995, pp. 961-964

SEGREGATION AND TRAPPING OF ERBIUM DURING SILICON MOLECULAR-BEAM EPITAXY

Authors: SERNA R LOHMEIER M ZAGWIJN PM VLIEG E POLMAN A

Citation: R. Serna et al., SEGREGATION AND TRAPPING OF ERBIUM DURING SILICON MOLECULAR-BEAM EPITAXY, Applied physics letters, 66(11), 1995, pp. 1385-1387

STRUCTURE-ANALYSIS OF THE HF-TREATED SI(111)H SURFACE WITH MEDIUM-ENERGY ION-SCATTERING

Authors: NISHIYAMA A TERHORST G LOHMEIER M MOLENBROEK AM FRENKEN JWM

Citation: A. Nishiyama et al., STRUCTURE-ANALYSIS OF THE HF-TREATED SI(111)H SURFACE WITH MEDIUM-ENERGY ION-SCATTERING, Surface science, 321(3), 1994, pp. 261-266

INTERFACE ROUGHNESS DURING THERMAL AND ION-INDUCED REGROWTH OF AMORPHOUS LAYERS ON SI(001)

Authors: LOHMEIER M DEVRIES S CUSTER JS VLIEG E FINNEY MS PRIOLO F BATTAGLIA A

Citation: M. Lohmeier et al., INTERFACE ROUGHNESS DURING THERMAL AND ION-INDUCED REGROWTH OF AMORPHOUS LAYERS ON SI(001), Applied physics letters, 64(14), 1994, pp. 1803-1805

ANGLE CALCULATIONS FOR A 6-CIRCLE SURFACE X-RAY DIFFRACTOMETER

Authors: LOHMEIER M VLIEG E

Citation: M. Lohmeier et E. Vlieg, ANGLE CALCULATIONS FOR A 6-CIRCLE SURFACE X-RAY DIFFRACTOMETER, Journal of applied crystallography, 26, 1993, pp. 706-716

Risultati: 1-12 |