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Results:
1-17
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Results: 17
Authors:
LU YW
SUNDARARAJAN N
SARATCHANDRAN P
Citation: Yw. Lu et al., PERFORMANCE EVALUATION OF A SEQUENTIAL MINIMAL RADIAL BASIS FUNCTION (RBF) NEURAL-NETWORK LEARNING ALGORITHM, IEEE transactions on neural networks, 9(2), 1998, pp. 308-318
Authors:
COLLINS RW
AN I
FUJIWARA H
LEE JC
LU YW
KOH JY
ROVIRA PI
Citation: Rw. Collins et al., ADVANCES IN MULTICHANNEL SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 18-32
Authors:
KOH J
FUJIWARA H
LU YW
WRONSKI CR
Citation: J. Koh et al., REAL-TIME SPECTROSCOPIC ELLIPSOMETRY FOR CHARACTERIZATION AND OPTIMIZATION OF AMORPHOUS SILICON-BASED SOLAR-CELL STRUCTURES, Thin solid films, 313, 1998, pp. 469-473
Authors:
KEITA B
LU YW
NADJO L
LE TT
Citation: B. Keita et al., AFM AND STM CHARACTERIZATION OF ELECTROCHEMICALLY MODIFIED ELECTRODESBASED ON A NEW NI-DIBENZOTETRAAZA(14) ANNULENE, Journal of electroanalytical chemistry [1992], 426(1-2), 1997, pp. 191-196
Authors:
LU YW
KEITA B
NADJO L
Citation: Yw. Lu et al., QUARTZ-CRYSTAL MICROBALANCE DETECTION AND QUANTIFICATION OF DIOXYGEN INTERACTION WITH NEW DISSYMMETRICAL METAL DIBENZOTETRAAZA[14]ANNULENES, New journal of chemistry, 21(5), 1997, pp. 581-588
Authors:
LU YW
SUNDARARAJAN N
SARATCHANDRAN P
Citation: Yw. Lu et al., A SEQUENTIAL LEARNING SCHEME FOR FUNCTION APPROXIMATION USING MINIMALRADIAL BASIS FUNCTION NEURAL NETWORKS, Neural computation, 9(2), 1997, pp. 461-478
Authors:
LU YW
Citation: Yw. Lu, DECISIVE ROLE OF AL3-BIS-(O-TOSYLAMINOPHENYL)PROPANEDIAMIDE TO N,N'-BIS-(O-AMINOPHENYL)PROPANEDIAMIDE( CATION IN THE ELECTRODETOSYLATION OFN,N'), Tetrahedron, 53(49), 1997, pp. 16721-16730
Authors:
NGUYEN HV
KIM SB
LU YW
WAKAGI M
COLLINS RW
Citation: Hv. Nguyen et al., A COMPARISON OF THE OPTICAL-PROPERTIES OF ULTRATHIN AMORPHOUS AND CRYSTALLINE SILICON FILMS, Journal of non-crystalline solids, 200, 1996, pp. 853-856
Authors:
COLLINS RW
BURNHAM JS
KIM S
KOH JY
LU YW
WRONSKI CR
Citation: Rw. Collins et al., INSIGHTS INTO DEPOSITION PROCESSES FOR AMORPHOUS-SEMICONDUCTOR MATERIALS AND DEVICES FROM REAL-TIME SPECTROSCOPIC ELLIPSOMETRY, Journal of non-crystalline solids, 200, 1996, pp. 981-986
Authors:
KOH J
LU YW
WRONSKI CR
KUANG YL
COLLINS RW
TSONG TT
STRAUSSER YE
Citation: J. Koh et al., CORRELATION OF REAL-TIME SPECTROELLIPSOMETRY AND ATOMIC-FORCE MICROSCOPY MEASUREMENTS OF SURFACE-ROUGHNESS ON AMORPHOUS-SEMICONDUCTOR THIN-FILMS, Applied physics letters, 69(9), 1996, pp. 1297-1299
Authors:
NGUYEN HV
LU YW
KIM SB
WAKAGI M
COLLINS RW
Citation: Hv. Nguyen et al., OPTICAL-PROPERTIES OF ULTRATHIN CRYSTALLINE AND AMORPHOUS-SILICON FILMS, Physical review letters, 74(19), 1995, pp. 3880-3883
Authors:
KOH J
LU YW
KIM S
BURNHAM JS
WRONSKI CR
COLLINS RW
Citation: J. Koh et al., REAL-TIME SPECTROSCOPIC ELLIPSOMETRY STUDY OF HYDROGENATED AMORPHOUS-SILICON P-I-N SOLAR-CELLS - CHARACTERIZATION OF MICROSTRUCTURAL EVOLUTION AND OPTICAL GAPS, Applied physics letters, 67(18), 1995, pp. 2669-2671
Authors:
KEITA B
LU YW
NADJO L
Citation: B. Keita et al., CHEMICALLY-MODIFIED ELECTRODES BASED ON NEW METAL-DIBENZOTETRAAZA[14]ANNULENES, Journal of electroanalytical chemistry [1992], 367(1-2), 1994, pp. 285-291
Authors:
NGUYEN HV
AN I
COLLINS RW
LU YW
WAKAGI M
WRONSKI CR
Citation: Hv. Nguyen et al., PREPARATION OF ULTRATHIN MICROCRYSTALLINE SILICON LAYERS BY ATOMIC-HYDROGEN ETCHING OF AMORPHOUS-SILICON AND END-POINT DETECTION BY REALTIME SPECTROELLIPSOMETRY, Applied physics letters, 65(26), 1994, pp. 3335-3337
Authors:
AN I
LU YW
WRONSKI CR
COLLINS RW
Citation: I. An et al., REAL-TIME SPECTROELLIPSOMETRY STUDY OF THE INTERACTION OF HYDROGEN WITH ZNO DURING ZNO A-SI1-XCXH INTERFACE FORMATION, Applied physics letters, 64(24), 1994, pp. 3317-3319
Authors:
COLLINS RW
AN I
NGUYEN HV
LU YW
Citation: Rw. Collins et al., REAL-TIME SPECTROSCOPIC ELLIPSOMETRY FOR CHARACTERIZATION OF NUCLEATION, GROWTH, AND OPTICAL FUNCTIONS OF THIN-FILMS, Thin solid films, 233(1-2), 1993, pp. 244-252
Authors:
LU YW
AN IS
GUNES M
WAKAGI M
WRONSKI CR
COLLINS RW
Citation: Yw. Lu et al., NUCLEATION AND GROWTH OF HYDROGENATED AMORPHOUS SILICON-CARBON ALLOYS- EFFECT OF HYDROGEN DILUTION IN PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION, Applied physics letters, 63(16), 1993, pp. 2228-2230
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1-17
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