AAAAAA

   
Results: 1-7 |
Results: 7
THERMAL MONITORING OF SELF-CHECKING SYSTEMS
Authors: SZEKELY V RENCZ M KARAM JM LUBASZEWSKI M COURTOIS B
Citation: V. Szekely et al., THERMAL MONITORING OF SELF-CHECKING SYSTEMS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 12(1-2), 1998, pp. 81-92
CAD TOOLS AND FOUNDRIES TO BOOST MICROSYSTEMS DEVELOPMENT
Authors: COURTOIS B KARAM JM LUBASZEWSKI M SZEKELY V RENCZ M HOFMANN K GLESNER M
Citation: B. Courtois et al., CAD TOOLS AND FOUNDRIES TO BOOST MICROSYSTEMS DEVELOPMENT, Materials science & engineering. B, Solid-state materials for advanced technology, 51(1-3), 1998, pp. 242-253
A RELIABLE FAIL-SAFE SYSTEM
Authors: LUBASZEWSKI M COURTOIS B
Citation: M. Lubaszewski et B. Courtois, A RELIABLE FAIL-SAFE SYSTEM, I.E.E.E. transactions on computers, 47(2), 1998, pp. 236-241
FAULT-BASED TESTING AND DIAGNOSIS OF BALANCED FILTERS
Authors: MIR S LUBASZEWSKI M KOLARIK V COURTOIS B
Citation: S. Mir et al., FAULT-BASED TESTING AND DIAGNOSIS OF BALANCED FILTERS, Analog integrated circuits and signal processing, 11(1), 1996, pp. 5-19
FAULT-BASED ATPG FOR LINEAR ANALOG CIRCUITS WITH MINIMAL SIZE MULTIFREQUENCY TEST SETS
Authors: MIR S LUBASZEWSKI M COURTOIS B
Citation: S. Mir et al., FAULT-BASED ATPG FOR LINEAR ANALOG CIRCUITS WITH MINIMAL SIZE MULTIFREQUENCY TEST SETS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 9(1-2), 1996, pp. 43-57
UNIFIED BUILT-IN SELF-TEST FOR FULLY DIFFERENTIAL ANALOG CIRCUITS
Authors: MIR S LUBASZEWSKI M COURTOIS B
Citation: S. Mir et al., UNIFIED BUILT-IN SELF-TEST FOR FULLY DIFFERENTIAL ANALOG CIRCUITS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 9(1-2), 1996, pp. 135-151
ANALOG CHECKERS WITH ABSOLUTE AND RELATIVE TOLERANCES
Authors: KOLARIK V MIR S LUBASZEWSKI M COURTOIS B
Citation: V. Kolarik et al., ANALOG CHECKERS WITH ABSOLUTE AND RELATIVE TOLERANCES, IEEE transactions on computer-aided design of integrated circuits and systems, 14(5), 1995, pp. 607-612
Risultati: 1-7 |