Authors: Lewis, D Pouget, V Beauchene, T Lapuyade, H Fouillat, P Touboul, A Beaudoin, F Perdu, P

Citation: D. Lewis et al., Front side and backside OBIT mappings applied to single event transient testing, MICROEL REL, 41(9-10), 2001, pp. 1471-1476

Authors: Pouget, V Lapuyade, H Fouillat, P Lewis, D Buchner, S

Citation: V. Pouget et al., Theoretical investigation of an equivalent laser LET, MICROEL REL, 41(9-10), 2001, pp. 1513-1518

Authors: Pouget, V Fouillat, P Lewis, D Lapuyade, H Darracq, F Touboul, A

Citation: V. Pouget et al., Laser cross section measurement for the evaluation of single-event effectsin integrated circuits, MICROEL REL, 40(8-10), 2000, pp. 1371-1375

Authors: Pouget, V Lapuyade, H Lewis, D Deval, Y Fouillat, P Sarger, L

Citation: V. Pouget et al., SPICE modeling of the transient response of irradiated MOSFETs, IEEE NUCL S, 47(3), 2000, pp. 508-513

Authors: Pouget, V Lewis, D Lapuyade, H Briand, R Fouillat, P Sarger, L Calvet, MC

Citation: V. Pouget et al., Validation of radiation hardened designs by pulsed laser testing and SPICEanalysis, MICROEL REL, 39(6-7), 1999, pp. 931-935