Citation: Hw. Lee et al., Flow visualization and film cooling effectiveness measurements around shaped holes with compound angle orientations, INT J HEAT, 45(1), 2002, pp. 145-156
Citation: Hk. Oh et al., Structure-reactivity correlations in the aminolysis of aryl dithiomethyl- and dithiophenylacetates with anilines in acetonitrile, J CHEM S P2, (9), 2001, pp. 1753-1757
Citation: Xb. Zou et al., Generation of two-mode nonclassical motional states and a Fredkin gate operation in a two-dimensional ion trap - art. no. 065801, PHYS REV A, 6306(6), 2001, pp. 5801
Citation: Hw. Lee et J. Kim, Quantum teleportation and Bell's inequality using single-particle entanglement - art. no. 012305, PHYS REV A, 6301(1), 2001, pp. 2305
Citation: H. Huh et al., The parametric process design of tension levelling with an elasto-plastic finite element method, J MATER PR, 113(1-3), 2001, pp. 714-719
Authors:
Song, KY
Park, MK
Kwon, YT
Lee, HW
Chung, WJ
Lee, WI
Citation: Ky. Song et al., Preparation of transparent particulate MoO3/TiO2 and WO3/TiO2 films and their photocatalytic properties, CHEM MATER, 13(7), 2001, pp. 2349-2355
Citation: Sh. Kim et al., Synthesis and properties of vinyl-terminated and silicon-containing polysulfones and polyketones, J POL SC PC, 39(17), 2001, pp. 2937-2942
Citation: Mz. Fang et al., Improvement of in vitro two-stage transformation assay and determination of the promotional effect of cadmium, TOX VITRO, 15(3), 2001, pp. 225-231
Citation: Hw. Lee et al., The relative contribution of consonants and vowels to word identification during reading, J MEM LANG, 44(2), 2001, pp. 189-205
Citation: Nj. Kim et al., Holographic principle in the Binetruy-Deffayet-Langlois brane cosmology - art. no. 064022, PHYS REV D, 6406(6), 2001, pp. 4022
Citation: Dh. Kwon et Hw. Lee, Wave packet dynamics in stabilization of ionization in a circularly polarized laser field, J KOR PHYS, 39(5), 2001, pp. 834-837
Citation: Ys. Mok et al., Flue gas treatment using pulsed corona discharge generated by magnetic pulse compression modulator, J ELECTROST, 53(3), 2001, pp. 195-208