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Results: 1-18 |
Results: 18
Experimental determination of the Andreev reflection probability using ballistic point contact spectroscopy
Authors: Jakob, M Appenzeller, J Knoch, J Stahl, H Lengeler, B
Citation: M. Jakob et al., Experimental determination of the Andreev reflection probability using ballistic point contact spectroscopy, MAT SCI E C, 15(1-2), 2001, pp. 63-65
Investigation of the inter-tube coupling in single-wall nanotube ropes
Authors: Stahl, H Appenzeller, J Lengeler, B Martel, R Avouris, P
Citation: H. Stahl et al., Investigation of the inter-tube coupling in single-wall nanotube ropes, MAT SCI E C, 15(1-2), 2001, pp. 291-294
Technology for the fabrication of ultrashort channel metal-oxide-semiconductor field-effect transistors
Authors: Knoch, J Appenzeller, J Lengeler, B Martel, R Solomon, P Avouris, P Dieker, C Lu, Y Wang, KL Scholvin, J del Alamo, JA
Citation: J. Knoch et al., Technology for the fabrication of ultrashort channel metal-oxide-semiconductor field-effect transistors, J VAC SCI A, 19(4), 2001, pp. 1737-1741
Recent developments in hard X-ray tomography
Authors: Rau, C Weitkamp, T Snigirev, A Schroer, CG Tummler, J Lengeler, B
Citation: C. Rau et al., Recent developments in hard X-ray tomography, NUCL INST A, 467, 2001, pp. 929-931
Parabolic refractive X-ray lenses: a breakthrough in X-ray optics
Authors: Lengeler, B Schroer, CG Benner, B Gunzler, TF Kuhlmann, M Tummler, J Simionovici, AS Drakopoulos, M Snigirev, A Snigireva, I
Citation: B. Lengeler et al., Parabolic refractive X-ray lenses: a breakthrough in X-ray optics, NUCL INST A, 467, 2001, pp. 944-950
Hard X-ray full field microscopy and magnifying microtomography using compound refractive lenses
Authors: Schroer, CG Gunzler, TF Benner, B Kuhlmann, M Tummler, J Lengeler, B Rau, C Weitkamp, T Snigirev, A Snigireva, I
Citation: Cg. Schroer et al., Hard X-ray full field microscopy and magnifying microtomography using compound refractive lenses, NUCL INST A, 467, 2001, pp. 966-969
Refractive lenses as a beam diagnostics tool for high-energy synchrotron radiation
Authors: Weitkamp, T Chubar, O Drakopoulos, M Souvorov, A Snigireva, I Snigirev, A Gunzler, F Schroer, C Lengeler, B
Citation: T. Weitkamp et al., Refractive lenses as a beam diagnostics tool for high-energy synchrotron radiation, NUCL INST A, 467, 2001, pp. 248-251
Phase-coherent transport in ropes of single-wall carbon nanotubes - art. no. 121404
Authors: Appenzeller, J Martel, R Avouris, P Stahl, H Hunger, UT Lengeler, B
Citation: J. Appenzeller et al., Phase-coherent transport in ropes of single-wall carbon nanotubes - art. no. 121404, PHYS REV B, 6412(12), 2001, pp. 1404
Coherence in X-ray physics
Authors: Lengeler, B
Citation: B. Lengeler, Coherence in X-ray physics, NATURWISSEN, 88(6), 2001, pp. 249-260
Optimized contact configuration for the study of transport phenomena in ropes of single-wall carbon nanotubes
Authors: Appenzeller, J Martel, R Avouris, P Stahl, H Lengeler, B
Citation: J. Appenzeller et al., Optimized contact configuration for the study of transport phenomena in ropes of single-wall carbon nanotubes, APPL PHYS L, 78(21), 2001, pp. 3313-3315
Intertube coupling in ropes of single-wall carbon nanotubes
Authors: Stahl, H Appenzeller, J Martel, R Avouris, P Lengeler, B
Citation: H. Stahl et al., Intertube coupling in ropes of single-wall carbon nanotubes, PHYS REV L, 85(24), 2000, pp. 5186-5189
Preparation of highly transparent superconductor-semiconductor contacts
Authors: Knoch, J Appenzeller, J Lengeler, B
Citation: J. Knoch et al., Preparation of highly transparent superconductor-semiconductor contacts, J APPL PHYS, 88(6), 2000, pp. 3522-3526
High-resolution X-ray fluorescence microtomography of homogeneous samples
Authors: Simionovici, A Chukalina, M Schroer, C Drakopoulos, M Snigirev, A Snigireva, I Lengeler, B Janssens, K Adams, F
Citation: A. Simionovici et al., High-resolution X-ray fluorescence microtomography of homogeneous samples, IEEE NUCL S, 47(6), 2000, pp. 2736-2740
Spectroscopic measurements on the Andreev reflection probability as a function of temperature
Authors: Appenzeller, J Jakob, M Stahl, H Knoch, J Lengeler, B
Citation: J. Appenzeller et al., Spectroscopic measurements on the Andreev reflection probability as a function of temperature, APPL PHYS L, 77(4), 2000, pp. 549-551
Direct determination of the Andreev reflection probability by means of point contact spectroscopy
Authors: Jakob, M Stahl, H Knoch, J Appenzeller, J Lengeler, B Hardtdegen, H Luth, H
Citation: M. Jakob et al., Direct determination of the Andreev reflection probability by means of point contact spectroscopy, APPL PHYS L, 76(9), 2000, pp. 1152-1154
Direct determination of the Andreev reflection probability by means of point contact spectroscopy (vol 76, pg 1152 2000)
Authors: Jakob, M Stahl, H Knoch, J Appenzeller, J Lengeler, B Hardtdegen, H Luth, H
Citation: M. Jakob et al., Direct determination of the Andreev reflection probability by means of point contact spectroscopy (vol 76, pg 1152 2000), APPL PHYS L, 76(19), 2000, pp. 2800-2800
Imaging by parabolic refractive lenses in the hard X-ray range
Authors: Lengeler, B Schroer, C Tummler, J Benner, B Richwin, M Snigirev, A Snigireva, I Drakopoulos, M
Citation: B. Lengeler et al., Imaging by parabolic refractive lenses in the hard X-ray range, J SYNCHROTR, 6, 1999, pp. 1153-1167
A microscope for hard x rays based on parabolic compound refractive lenses
Authors: Lengeler, B Schroer, CG Richwin, M Tummler, J Drakopoulos, M Snigirev, A Snigireva, I
Citation: B. Lengeler et al., A microscope for hard x rays based on parabolic compound refractive lenses, APPL PHYS L, 74(26), 1999, pp. 3924-3926
Risultati: 1-18 |