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Results: 1-12 |
Results: 12
Anomalous diffraction with soft X-ray synchrotron radiation: DANES from pentakismethylammonium undecachlorodibismuthate at the K absorption edge of chlorine
Authors: Carpentier, P Capitan, M Chesne, ML Fanchon, E Kahn, R Lequien, S Stuhrmann, H Thiaudiere, D Vicat, J Zajac, W Zielinski, P
Citation: P. Carpentier et al., Anomalous diffraction with soft X-ray synchrotron radiation: DANES from pentakismethylammonium undecachlorodibismuthate at the K absorption edge of chlorine, J ALLOY COM, 328(1-2), 2001, pp. 64-70
Austenitic steel corrosion in IGCC environment. Characterisation by photonand nuclear microprobes
Authors: Dillmann, P Weulersse, K Regad, B Moulin, G Barrett, R Bonnin-Mosbah, M Lequien, S Berger, P
Citation: P. Dillmann et al., Austenitic steel corrosion in IGCC environment. Characterisation by photonand nuclear microprobes, NUCL INST B, 181, 2001, pp. 734-738
Influence of the electrolyte viscosity on the structural features of porous silicon
Authors: Servidori, M Ferrero, C Lequien, S Milita, S Parisini, A Romestain, R Sama, S Setzu, S Thiaudiere, D
Citation: M. Servidori et al., Influence of the electrolyte viscosity on the structural features of porous silicon, SOL ST COMM, 118(2), 2001, pp. 85-90
Porous silicon characterization by x-ray reflectivity: problems arising from using a vacuum environment with synchrotron beam
Authors: Sama, S Ferrero, C Lequien, S Milita, S Romestain, R Servidori, M Setzu, S Thiaudiere, D
Citation: S. Sama et al., Porous silicon characterization by x-ray reflectivity: problems arising from using a vacuum environment with synchrotron beam, J PHYS D, 34(6), 2001, pp. 841-845
The hydration structure of Br- from anomalous x-ray diffraction
Authors: Ramos, S Barnes, AC Neilson, GW Thiaudiere, D Lequien, S
Citation: S. Ramos et al., The hydration structure of Br- from anomalous x-ray diffraction, J PHYS-COND, 12(8A), 2000, pp. A203-A208
Grazing-incidence small-angle X-ray scattering applied to the characterization of aggregates in surface regions
Authors: Naudon, A Babonneau, D Thiaudiere, D Lequien, S
Citation: A. Naudon et al., Grazing-incidence small-angle X-ray scattering applied to the characterization of aggregates in surface regions, PHYSICA B, 283(1-3), 2000, pp. 69-74
Structural and morphological studies of Co/SiO2 discontinuous multilayers
Authors: Thiaudiere, D Proux, O Micha, JS Revenant, C Regnard, JR Lequien, S
Citation: D. Thiaudiere et al., Structural and morphological studies of Co/SiO2 discontinuous multilayers, PHYSICA B, 283(1-3), 2000, pp. 114-118
The ID01 beamline at the ESRF: the diffuse scattering technique applied tosurface and interface studies
Authors: Capitan, MJ Thiaudiere, D Goirand, L Taffut, R Lequien, S
Citation: Mj. Capitan et al., The ID01 beamline at the ESRF: the diffuse scattering technique applied tosurface and interface studies, PHYSICA B, 283(1-3), 2000, pp. 256-261
Feasibility and review of anomalous X-ray diffraction at long wavelengths in materials research and protein crystallography
Authors: Kahn, R Carpentier, P Berthet-Colominas, C Capitan, M Chesne, ML Fanchon, E Lequien, S Thiaudiere, D Vicat, J Zielinski, P Stuhrmann, H
Citation: R. Kahn et al., Feasibility and review of anomalous X-ray diffraction at long wavelengths in materials research and protein crystallography, J SYNCHROTR, 7, 2000, pp. 131-138
Anomalous X-ray diffraction with soft X-ray synchrotron radiation
Authors: Carpentier, P Berthet-Colominas, C Capitan, M Chesne, ML Fanchon, E Lequien, S Stuhrmann, H Thiaudiere, D Vicat, J Zielinski, P Kahn, R
Citation: P. Carpentier et al., Anomalous X-ray diffraction with soft X-ray synchrotron radiation, CELL MOL B, 46(5), 2000, pp. 915-935
Oxidation study of Co/Cu multilayers by resonant X-ray reflectivity
Authors: de Bernabe, A Capitan, MJ Fischer, HE Lequien, S Mompean, FJ Prieto, C Quiros, C Colino, J Lefebvre, S Bessiere, M Sanz, JM
Citation: A. De Bernabe et al., Oxidation study of Co/Cu multilayers by resonant X-ray reflectivity, VACUUM, 52(1-2), 1999, pp. 109-113
Morphological characterization of ion-sputtered C-Ag C/C-Ag and Ag/C filmsby GISAXS
Authors: Babonneau, D Naudon, A Thiaudiere, D Lequien, S
Citation: D. Babonneau et al., Morphological characterization of ion-sputtered C-Ag C/C-Ag and Ag/C filmsby GISAXS, J APPL CRYS, 32, 1999, pp. 226-233
Risultati: 1-12 |