Authors:
Lewis, A
Shambrot, E
Radko, A
Lieberman, K
Ezekiel, S
Veinger, D
Yampolski, G
Citation: A. Lewis et al., Failure analysis of integrated circuits beyond the diffraction limit: Contact mode near-field scanning optical microscopy with integrated resistance,capacitance, and UV confocal imaging, P IEEE, 88(9), 2000, pp. 1471-1479
Authors:
Dekhter, R
Khachatryan, E
Kokotov, Y
Lewis, A
Kokotov, S
Fish, G
Shambrot, Y
Lieberman, K
Citation: R. Dekhter et al., Investigating material and functional properties of static random access memories using cantilevered glass multiple-wire force-sensing thermal probes, APPL PHYS L, 77(26), 2000, pp. 4425-4427