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Results:
1-8
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Results: 8
Authors:
Suortti, P
Buslaps, T
DiMichiel, M
Honkimaki, V
Lienert, U
McCarthy, JE
Merino, JM
Shukla, A
Citation: P. Suortti et al., Dispersion-compensating scanning X-ray spectrometer for Compton profile measurements, NUCL INST A, 467, 2001, pp. 1541-1544
Authors:
Lienert, U
Keitel, S
Caliebe, W
Schulze-Briese, C
Poulsen, HF
Citation: U. Lienert et al., Source size conserving broad band monochromators of fixed exit geometry for high energy synchrotron radiation, NUCL INST A, 467, 2001, pp. 659-662
Authors:
Poulsen, HF
Nielsen, SF
Lauridsen, EM
Schmidt, S
Suter, RM
Lienert, U
Margulies, L
Lorentzen, T
Jensen, DJ
Citation: Hf. Poulsen et al., Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders, J APPL CRYS, 34, 2001, pp. 751-756
Authors:
Lienert, U
Poulsen, HF
Kvick, A
Citation: U. Lienert et al., Mesoscale structural characterization within bulk materials by high-energyx-ray microdiffraction, AIAA J, 39(5), 2001, pp. 919-923
Authors:
Lauridsen, EM
Jensen, DJ
Poulsen, HF
Lienert, U
Citation: Em. Lauridsen et al., Kinetics of individual grains during recrystallization, SCR MATER, 43(6), 2000, pp. 561-566
Authors:
Nielsen, SF
Wolf, A
Poulsen, HF
Ohler, M
Lienert, U
Owen, RA
Citation: Sf. Nielsen et al., A conical slit for three-dimensional XRD mapping, J SYNCHROTR, 7, 2000, pp. 103-109
Authors:
Lienert, U
Poulsen, HF
Honkimaki, V
Schulze, C
Hignette, O
Citation: U. Lienert et al., A focusing multilayer analyser for local diffraction studies, J SYNCHROTR, 6, 1999, pp. 979-984
Authors:
Suortti, P
Buslaps, T
Fajardo, P
Honkimaki, V
Kretzschmer, M
Lienert, U
McCarthy, JE
Renier, M
Shukla, A
Tschentscher, T
Meinander, T
Citation: P. Suortti et al., Scanning x-ray spectrometer for high-resolution Compton profile measurements at ESRF, J SYNCHROTR, 6, 1999, pp. 69-80
Risultati:
1-8
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