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Results:
1-4
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Results: 4
Minimizing errors in electron microprobe analysis
Authors:
Lifshin, E Gauvin, R
Citation:
E. Lifshin et R. Gauvin, Minimizing errors in electron microprobe analysis, MICROS MICR, 7(2), 2001, pp. 168-177
Simulation of X-ray emission from rough surfaces
Authors:
Gauvin, R Lifshin, E
Citation:
R. Gauvin et E. Lifshin, Simulation of X-ray emission from rough surfaces, MIKROCH ACT, 132(2-4), 2000, pp. 201-204
Electron backscattering profile of rough surfaces
Authors:
Gauvin, R Lifshin, E
Citation:
R. Gauvin et E. Lifshin, Electron backscattering profile of rough surfaces, SCANNING, 21(2), 1999, pp. 144-145
Statistical considerations in microanalysis by energy-dispersive spectrometry
Authors:
Lifshin, E Doganaksoy, N Sirois, J Gauvin, R
Citation:
E. Lifshin et al., Statistical considerations in microanalysis by energy-dispersive spectrometry, MICROS MICR, 4(6), 1998, pp. 598-604
Risultati:
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