Authors:
Lin-Kwang, J
Ramey, S
Reynes, JM
Hillard, RJ
Thieme, T
Citation: J. Lin-kwang et al., The role of spreading resistance profiling in manufacturing control and technology development, MICROEL REL, 40(8-10), 2000, pp. 1497-1502
Authors:
Delage, C
Nolhier, N
Bafleur, M
Dorkel, JM
Hamid, J
Givelin, P
Lin-Kwang, J
Citation: C. Delage et al., The mirrored lateral SCR (MILSCR) as an ESD protection structure: Design and optimization using 2-D device simulation, IEEE J SOLI, 34(9), 1999, pp. 1283-1289