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Results:
1-7
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Results: 7
Authors:
Nejjar, R
Rghioui, L
El Jouhari, N
Benarafa, L
Knidiri, M
Lorriaux, A
Wallart, F
Citation: R. Nejjar et al., Structural study of ACaLn(PO4)(2) (A = K, Rb, Cs; Ln = rare earth) using vibrational spectroscopies and optical probes, CAN J A S S, 45(5-6), 2000, pp. 140-147
Authors:
Peng, J
Raverdy, N
Ganry, O
de la Roche-Saint-Andre, G
Dubreuil, A
Lorriaux, A
Citation: J. Peng et al., Descriptive epidemiology of upper aerodigestive tract cancers in the department of Somme, B CANCER, 87(2), 2000, pp. 201-206
Authors:
Rghioui, L
El Ammari, L
Benarafa, L
Knidiri, M
Lorriaux, A
Wallart, F
Krautscheid, H
Citation: L. Rghioui et al., X-ray diffraction analysis and vibration spectroscopy of the structure of vanadate K2CsLa(VO4)(2), CAN J A S S, 44(3), 1999, pp. 89-96
Authors:
Nejjar, R
Rghioui, L
Benarafa, L
Idrissi, MS
Knidiri, M
Boukhari, A
Lorriaux, A
Wallart, F
Citation: R. Nejjar et al., Vibration spectra of mixed AMP(2)O(7)-type triclinic diphosphates (A : Ca,Ba; M : Mg, Co, Ni, Cu, Zn, Cd) - Correlation with spectra and structures, CAN J A S S, 44(1), 1999, pp. 26-32
Authors:
Boudart, B
Gaquiere, C
Constant, M
Lorriaux, A
Lefebvre, N
Citation: B. Boudart et al., Raman characterization of SiNx deposition on undoped Ga0.47In0.53As material grown on InP substrate, J RAMAN SP, 30(8), 1999, pp. 715-719
Authors:
Boudart, B
Gaquiere, C
Trassaert, S
Constant, M
Lorriaux, A
Lefebvre, N
Citation: B. Boudart et al., Raman characterization of SiNx deposition on undoped Al0.48In0.52As and n(+) Ga0.47In0.53As layers for InP high electron mobility transistor applications, APPL PHYS L, 74(21), 1999, pp. 3221-3223
Authors:
Nejjar, R
Rghioui, L
Benarafa, L
Zaydoun, S
Idrissi, MS
Boukhari, A
Lorriaux, A
Wallart, F
Citation: R. Nejjar et al., Vibration spectra of new orthorhombic diphosphates SrPbP2O7 and BaPbP2O7, CAN J A S S, 43(6), 1998, pp. 171-176
Risultati:
1-7
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