Authors: OHSUGI T IWATA Y OHYAMA H OHMOTO T YOSHIKAWA M HANDA T KURINO K FUJITA K TAMURA N HATAKENAKA T MAEOHMICHI M TAKAHATA M NAKAO M ASAI M KIMURA A TAKASHIMA R YAMAMOTO K YAMAMURA K

Citation: T. Ohsugi et al., MICRO-DISCHARGE AT STRIP EDGE OF SILICON MICROSTRIP SENSORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 383(1), 1996, pp. 116-122

Authors: OHSUGI T IWATA Y OHYAMA H OHMOTO T YOSHIKAWA M HANDA T KURINO K FUJITA K KITABAYASHI H TAMURA N HATAKENAKA T MAEOHMICHI M TAKAHATA M NAKAO M IWASAKI H KOHRIKI T TERADA S UNNO Y TAKASHIMA R YAMAMOTO K YAMAMURA K

Citation: T. Ohsugi et al., MICRO-DISCHARGE NOISE AND RADIATION-DAMAGE OF SILICON MICROSTRIP SENSORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 383(1), 1996, pp. 166-173