Authors:
OGG S
LESAGE S
JERVIS BW
MAIDON Y
ZIMMER T
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Citation: Y. Maidon et al., DIAGNOSIS OF MULTIFAULTS IN ANALOG CIRCUITS USING MULTILAYER PERCEPTRONS, IEE proceedings. Circuits, devices and systems, 144(3), 1997, pp. 149-154
Citation: P. Fouillat et al., ANALYSIS OF LATCHUP SUSCEPTIBILITY TO INTERNAL LOGICAL STATES BY USING A LASER-BEAM, Microelectronic engineering, 31(1-4), 1996, pp. 79-86