Authors: DELABARDONNIE M MAOUAD A MIALHE P

Citation: M. Delabardonnie et al., SILICON-OXIDE DEFECTS IN AGING OF MOS ELECTRONIC DEVICES, Journal of non-crystalline solids, 216, 1997, pp. 209-212

Authors: DELABARDONNIE M MAOUAD A MIALHE P ELMAZRIA O HOFFMANN A LEPLEY B CHARLES JP

Citation: M. Delabardonnie et al., CHARACTERIZATION METHOD FOR IONIZING-RADIATION DEGRADATION IN POWER MOSFETS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1622-1627