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Results:
1-8
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Results: 8
Authors:
MCGUIRE SC
SULCER JD
Citation: Sc. Mcguire et Jd. Sulcer, NICKEL ALUMINIDE THIN-FILM FABRICATION VIA ION-BEAM SPUTTERING OF COMPOUND TARGETS, Surface & coatings technology, 101(1-3), 1998, pp. 362-365
Authors:
KERNESS ND
HOSSAIN TZ
MCGUIRE SC
Citation: Nd. Kerness et al., IMPURITY STUDY OF ALUMINA AND ALUMINUM NITRIDE CERAMICS - MICROELECTRONICS PACKAGING APPLICATIONS, Applied radiation and isotopes, 48(1), 1997, pp. 5-9
Authors:
MCGUIRE SC
CLARK DD
HOLCOMB DF
Citation: Sc. Mcguire et al., MODERN PHYSICS CONCEPTS TAUGHT VIA A NEUTRON-ACTIVATION ANALYSIS LABORATORY, American journal of physics, 64(11), 1996, pp. 1384-1388
Authors:
MCGUIRE SC
HOSSAIN TZ
GOLKOWSKI C
KERNESS ND
SULCER JD
Citation: Sc. Mcguire et al., MULTIELEMENT MATRIX ANALYSIS USING REACTOR SPECTRUM NEUTRONS, Applied radiation and isotopes, 46(6-7), 1995, pp. 555-556
Authors:
MCGUIRE SC
HOSSAIN TZ
GOLKOWSKI C
KERNESS ND
SULCER JD
Citation: Sc. Mcguire et al., APPLICATIONS OF NEUTRON-ACTIVATION TO MICROELECTRONIC MATERIALS RESEARCH AT THE CORNELL TRIGA REACTOR, Journal of radioanalytical and nuclear chemistry, 192(1), 1995, pp. 65-72
Authors:
MASS JL
BURLITCH JM
MCGUIRE SC
HOSSAIN TZ
DEMIRALP R
Citation: Jl. Mass et al., NEUTRON-ACTIVATION ANALYSIS OF ALUMINUM IN MG2SIO4, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 353(1-3), 1994, pp. 606-609
Authors:
MCGUIRE SC
HOSSAIN TZ
SOAVE RJ
Citation: Sc. Mcguire et al., IMPURITY CHARACTERIZATION OF SI(1-X)GE(X) CIRCUIT STRUCTURES WITH THEUSE OF NEUTRON-ACTIVATION ANALYSIS, Nuclear science and engineering, 117(2), 1994, pp. 134-139
Authors:
MCGUIRE SC
HOSSAIN TZ
SOAVE RJ
Citation: Sc. Mcguire et al., 1266-KEV GAMMA BRANCH IN SI-31 DECAY, Physical review. C. Nuclear physics, 48(3), 1993, pp. 1434-1437
Risultati:
1-8
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