Authors: BUCHNER S OLMOS M CHEYNET P VELAZCO R MCMORROW D MELINGER J ECOFFET R MULLER JD

Citation: S. Buchner et al., PULSED-LASER VALIDATION OF RECOVERY MECHANISMS OF CRITICAL SEES IN ANARTIFICIAL NEURAL-NETWORK SYSTEM, IEEE transactions on nuclear science, 45(3), 1998, pp. 1501-1507

Authors: BUCHNER S BAZE M BROWN D MCMORROW D MELINGER J

Citation: S. Buchner et al., COMPARISON OF ERROR RATES IN COMBINATIONAL AND SEQUENTIAL LOGIC, IEEE transactions on nuclear science, 44(6), 1997, pp. 2209-2216

Authors: REED RA CARTS MA MARSHALL PW MARSHALL CJ MUSSEAU O MCNULTY PJ ROTH DR BUCHNER S MELINGER J CORBIERE T

Citation: Ra. Reed et al., HEAVY-ION AND PROTON-INDUCED SINGLE EVENT MULTIPLE UPSET, IEEE transactions on nuclear science, 44(6), 1997, pp. 2224-2229

Authors: MUSSEAU O GARDIC F ROCHE P CORBIERE T REED RA BUCHNER S MCDONALD P MELINGER J TRAN L CAMPBELL AB

Citation: O. Musseau et al., ANALYSIS OF MULTIPLE BIT UPSETS (MBU) IN A CMOS SRAM, IEEE transactions on nuclear science, 43(6), 1996, pp. 2879-2888

Authors: BUCHNER S CAMPBELL AB MCMORROW D MELINGER J MASTI M CHEN YJ

Citation: S. Buchner et al., MODIFICATION OF SINGLE EVENT UPSET CROSS-SECTION OF AN SRAM AT HIGH-FREQUENCIES, IEEE transactions on nuclear science, 43(3), 1996, pp. 924-930

Authors: BUCHNER S MCMORROW D MELINGER J CAMPBELL AB

Citation: S. Buchner et al., LABORATORY TESTS FOR SINGLE-EVENT EFFECTS, IEEE transactions on nuclear science, 43(2), 1996, pp. 678-686