Authors:
MENCIK J
MUNZ D
QUANDT E
WEPPELMANN ER
SWAIN MV
Citation: J. Mencik et al., DETERMINATION OF ELASTIC-MODULUS OF THIN-LAYERS USING NANOINDENTATION, Journal of materials research, 12(9), 1997, pp. 2475-2484
Citation: J. Mencik et al., ELASTIC-MODULUS OF TBDYFE FILMS - A COMPARISON OF NANOINDENTATION ANDBENDING MEASUREMENTS, Thin solid films, 287(1-2), 1996, pp. 208-213
Citation: J. Mencik et Mv. Swain, ERRORS ASSOCIATED WITH DEPTH-SENSING MICROINDENTATION TESTS, Journal of materials research, 10(6), 1995, pp. 1491-1501
Citation: Mv. Swain et J. Mencik, MECHANICAL PROPERTY CHARACTERIZATION OF THIN-FILMS USING SPHERICAL TIPPED INDENTERS, Thin solid films, 253(1-2), 1994, pp. 204-211