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Results:
1-22
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Results: 22
Authors:
MENYHARD M
SULYOK A
Citation: M. Menyhard et A. Sulyok, AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILING OF GE SI MULTILAYERS USING HE+ AND AR+ IONS/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1091-1095
Authors:
ZOMMER L
LESIAK B
JABLONSKI A
GERGELY G
MENYHARD M
SULYOK A
GURBAN S
Citation: L. Zommer et al., DETERMINATION OF THE INELASTIC MEAN FREE-PATH OF ELECTRONS IN GAAS AND INP AFTER SURFACE CLEANING BY ION-BOMBARDMENT USING ELASTIC PEAK ELECTRON-SPECTROSCOPY, Journal of electron spectroscopy and related phenomena, 87(3), 1998, pp. 177-185
Authors:
BARNA A
PECZ B
MENYHARD M
Citation: A. Barna et al., AMORPHIZATION AND SURFACE-MORPHOLOGY DEVELOPMENT AT LOW-ENERGY ION MILLING, Ultramicroscopy, 70(3), 1998, pp. 161-171
Authors:
HARRY E
PAULEAU Y
ADAMIK M
BARNA PB
SULYOK A
MENYHARD M
Citation: E. Harry et al., GROWTH-CHARACTERISTICS OF TUNGSTEN-CARBON FILMS DEPOSITED BY MAGNETRON SPUTTERING, Surface & coatings technology, 101(1-3), 1998, pp. 291-294
Authors:
ZELTSER AM
PENTEK K
MENYHARD M
SULYOK A
Citation: Am. Zeltser et al., THERMAL-STABILITY OF COFE, CO AND NIFE CO SPIN VALVES/, IEEE transactions on magnetics, 34(4), 1998, pp. 1417-1419
Authors:
KONKOL A
MENYHARD M
Citation: A. Konkol et M. Menyhard, DETERMINATION OF THE ION SPUTTERING-INDUCED IN-DEPTH DISTRIBUTION BY MEANS OF ELASTIC PEAK ELECTRON-SPECTROSCOPY, Surface and interface analysis, 25(9), 1997, pp. 699-706
Authors:
GERGELY G
KONKOL A
MENYHARD M
LESIAK B
JABLONSKI A
VARGA D
TOTH J
Citation: G. Gergely et al., DETERMINATION OF THE INELASTIC MEAN FREE-PATH (IMFP) OF ELECTRONS IN GERMANIUM AND SILICON BY ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES) USING AN ANALYZER OF HIGH-RESOLUTION, Vacuum, 48(7-9), 1997, pp. 621-624
Authors:
SULYOK A
MENYHARD M
Citation: A. Sulyok et M. Menyhard, DETECTION OF DEEPLY BURIED THIN OXIDE LAYER BY MEANS OF AUGER DEPTH PROFILING, Review of scientific instruments, 68(7), 1997, pp. 2847-2849
Authors:
BARNA A
MENYHARD M
Citation: A. Barna et M. Menyhard, STUDY OF LOW-ENERGY ATOMIC MIXING BY MEANS OF AUGER DEPTH PROFILING, XTEM AND TRIM SIMULATION ON GE SI MULTILAYER SYSTEM/, Surface and interface analysis, 24(7), 1996, pp. 476-480
Authors:
CSAHOK Z
FARKAS Z
MENYHARD M
GERGELY G
DAROCZI CS
Citation: Z. Csahok et al., SURFACE-MORPHOLOGY DEVELOPMENT DURING ION SPUTTERING - ROUGHENING OR SMOOTHING, Surface science, 364(2), 1996, pp. 600-604
Authors:
BIKA D
PFAENDTNER JA
MENYHARD M
MCMAHON CJ
Citation: D. Bika et al., SULFUR-INDUCED DYNAMIC EMBRITTLEMENT IN A LOW-ALLOY STEEL, Acta metallurgica et materialia, 43(5), 1995, pp. 1895-1908
Authors:
MENYHARD M
BARNA A
BIERSACK JP
JARRENDAHL K
SUNDGREN JE
Citation: M. Menyhard et al., STUDY OF ION MIXING DURING AUGER DEPTH PROFILING OF GE-SI MULTILAYER SYSTEM .2. LOW ION ENERGY (0.2-2 KEV) RANGE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(4), 1995, pp. 1999-2004
Authors:
MENYHARD M
KONKOL A
GERGELY G
BARNA A
Citation: M. Menyhard et al., THE USE OF ELASTIC PEAK SPECTROSCOPY IN-DEPTH PROFILING, Vacuum, 46(8-10), 1995, pp. 1171-1171
Authors:
GERGELY G
MENYHARD M
PENTEK K
SULYOK A
JABLONSKI A
LESIAK B
DAROCZI C
Citation: G. Gergely et al., EXPERIMENTAL-DETERMINATION OF THE INELASTIC MEAN FREE-PATH FOR CU, AG, W, AU AND TA, IN THE ENERGY-RANGE 500-3000 EV BY ELASTIC PEAK ELECTRON-SPECTROSCOPY AND USING NI REFERENCE SAMPLE, Vacuum, 46(5-6), 1995, pp. 591-594
Authors:
GERGELY G
MENYHARD M
PENTEK K
SULYOK A
JABLONSKI A
LESIAK B
DAROCZI C
Citation: G. Gergely et al., EXPERIMENTAL-DETERMINATION OF THE INELASTIC MEAN FREE-PATH (IMFP) OF ELECTRONS IN CR, MO, GE AND SI BASED ON THE ELASTIC PEAK INTENSITY RATIO WITH A NI REFERENCE SAMPLE, Surface science, 333, 1995, pp. 1203-1207
Authors:
MENYHARD M
YAN M
VITEK V
Citation: M. Menyhard et al., ATOMISTIC VS PHENOMENOLOGICAL APPROACHES TO GRAIN-BOUNDARY SEGREGATION - COMPUTER MODELING OF CU-AG ALLOYS, Acta metallurgica et materialia, 42(8), 1994, pp. 2783-2796
Authors:
MENYHARD M
BARNA A
BIERSACK JP
Citation: M. Menyhard et al., STUDY OF ION MIXING DURING AUGER-ELECTRON SPECTROSCOPY DEATH PROFILING OF GE-SI MULTILAYER SYSTEM, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2368-2372
Authors:
KONKOL A
SULYOK A
MENYHARD M
BARNA A
Citation: A. Konkol et al., AUGER IN-DEPTH PROFILING OF MO-SI MULTILAYERS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(2), 1994, pp. 436-442
Authors:
MENYHARD M
KONKOL A
GERGELY G
BARNA A
Citation: M. Menyhard et al., DEVELOPMENT IN AUGER DEPTH PROFILING TECHNIQUE, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 653-657
Authors:
MENYHARD M
BARNA A
SULYOK A
JARRENDAHL K
SUNDGREN JE
BIERSACK JP
Citation: M. Menyhard et al., LOW-ENERGY ION MIXING IN SI-GE MULTILAYER SYSTEM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 383-387
Authors:
BARNA A
MENYHARD M
Citation: A. Barna et M. Menyhard, AUGER DEPTH PROFILE ANALYSIS OF DEEPLY BURIED INTERFACES, Physica status solidi. a, Applied research, 145(2), 1994, pp. 263-274
Authors:
MENYHARD M
ROTHMAN B
MCMAHON CJ
Citation: M. Menyhard et al., OBSERVATIONS OF SEGREGATION AND GRAIN-BOUNDARY FACETING BY TELLURIUM AND OXYGEN IN IRON, Scripta metallurgica et materialia, 29(8), 1993, pp. 1005-1009
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