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Results: 1-7 |
Results: 7

Authors: MIHALCEA C SCHOLZ W MALAVE A ALBERT D KULISCH W OESTERSCHULZE E
Citation: C. Mihalcea et al., FABRICATION OF MONOLITHIC DIAMOND PROBES FOR SCANNING PROBE MICROSCOPY APPLICATIONS, Applied physics A: Materials science & processing, 66, 1998, pp. 87-90

Authors: WERNER S RUDOW O MIHALCEA C OESTERSCHULZE E
Citation: S. Werner et al., CANTILEVER PROBES WITH APERTURE TIPS FOR POLARIZATION-SENSITIVE SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 367-370

Authors: OESTERSCHULZE E RUDOW O MIHALCEA C SCHOLZ W WERNER S
Citation: E. Oesterschulze et al., CANTILEVER PROBES FOR SNOM APPLICATIONS WITH SINGLE AND DOUBLE APERTURE TIPS, Ultramicroscopy, 71(1-4), 1998, pp. 85-92

Authors: KULISCH W MALAVE A LIPPOLD G SCHOLZ W MIHALCEA C OESTERSCHULZE E
Citation: W. Kulisch et al., FABRICATION OF INTEGRATED DIAMOND CANTILEVERS WITH TIPS FOR SPM APPLICATIONS, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 906-911

Authors: MUNSTER S WERNER S MIHALCEA C SCHOLZ W OESTERSCHULZE E
Citation: S. Munster et al., NOVEL MICROMACHINED CANTILEVER SENSORS FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Journal of Microscopy, 186, 1997, pp. 17-22

Authors: OESTERSCHULZE E SCHOLZ W MIHALCEA C ALBERT D SOBISCH B KULISCH W
Citation: E. Oesterschulze et al., FABRICATION OF SMALL DIAMOND TIPS FOR SCANNING PROBE MICROSCOPY APPLICATION, Applied physics letters, 70(4), 1997, pp. 435-437

Authors: MIHALCEA C SCHOLZ W WERNER S MUNSTER S OESTERSCHULZE E KASSING R
Citation: C. Mihalcea et al., MULTIPURPOSE SENSOR TIPS FOR SCANNING NEAR-FIELD MICROSCOPY, Applied physics letters, 68(25), 1996, pp. 3531-3533
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