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Results: 1-9 |
Results: 9

Authors: MOLLER MO GERHARD T RESS HR LANDWEHR G
Citation: Mo. Moller et al., NEW METHODS FOR DEPTH PROFILING OF HETEROSTRUCTURES BY X-RAY-DIFFRACTION, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 321-328

Authors: LI M MOLLER MO RESS HR FASCHINGER W LANDWEHR G
Citation: M. Li et al., THE INTERPRETATION OF X-RAY ROCKING CURVES BY THE FOURIER-TRANSFORM METHOD, Journal of physics. D, Applied physics, 30(24), 1997, pp. 3296-3300

Authors: LI M MOLLER MO LANDWEHR G
Citation: M. Li et al., FITTING OF X-RAY OR NEUTRON SPECULAR REFLECTIVITY OF MULTILAYERS BY FOURIER-ANALYSIS, Journal of applied physics, 80(5), 1996, pp. 2788-2790

Authors: BACHER G TONNIES D EISERT D FORCHEL A MOLLER MO KORN M JOBST B HOMMEL D LANDWEHR G SOLLNER J HEUKEN M
Citation: G. Bacher et al., THERMAL-STABILITY OF (ZN,CD)(SE,S) HETEROSTRUCTURES GROWN ON GAAS, Journal of applied physics, 79(8), 1996, pp. 4368-4372

Authors: HEINKE H EINFELDT S KUHNHEINRICH B PLAHL G MOLLER MO LANDWEHR G
Citation: H. Heinke et al., APPLICATION OF THE MODEL OF THE RELAXATION LINE IN RECIPROCAL SPACE TO II-VI HETEROSTRUCTURES, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 104-108

Authors: MOLLER MO BEYERSDORFER V HOMMEL D BEHR T HEINKE H LIPPMANN T LANDWEHR G
Citation: Mo. Moller et al., STRUCTURAL CHARACTERIZATION AND INTERFACIAL STUDIES OF ZNSE BASED HETEROSTRUCTURES ON GAAS, Journal of crystal growth, 143(3-4), 1994, pp. 162-171

Authors: HEINKE H MOLLER MO HOMMEL D LANDWEHR G
Citation: H. Heinke et al., RELAXATION AND MOSAICITY PROFILES IN EPITAXIAL LAYERS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION, Journal of crystal growth, 135(1-2), 1994, pp. 41-52

Authors: HEINKE H WAAG A MOLLER MO REGNET MM LANDWEHR G
Citation: H. Heinke et al., UNUSUAL STRAIN IN HOMOEPITAXIAL CDTE(001) LAYERS GROWN BY MOLECULAR-BEAM EPITAXY, Journal of crystal growth, 135(1-2), 1994, pp. 53-60

Authors: MOLLER MO
Citation: Mo. Moller, APPARATUS FUNCTION OF A 5-CRYSTAL X-RAY DIFFRACTOMETER WITH A 4-REFLECTION MONOCHROMATOR, Journal of applied crystallography, 27, 1994, pp. 369-378
Risultati: 1-9 |