Citation: R. Nowak et al., AMORPHIZATION OF THE SILICON SUBSTRATE AND STRESS-RELAXATION IN HFN FILMS BOMBARDED WITH AU IONS, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 253(1-2), 1998, pp. 328-336
Authors:
CIACH R
MORGIEL J
MAZIARZ W
MANOILOV EG
KAGANOVICH EB
SVECHNIKOV SV
SHEREGII EM
Citation: R. Ciach et al., SILICON-BASED MULTILAYER STRUCTURES PREPARED BY REACTIVE PULSED-LASERDEPOSITION, Thin solid films, 318(1-2), 1998, pp. 154-157
Citation: J. Morgiel et J. Dutkiewicz, MARTENSITIC-TRANSFORMATION IN AGED CUZNSN SHAPE-MEMORY ALLOYS, Journal de physique. IV, 5(C8), 1995, pp. 991-996
Citation: P. Zieba et J. Morgiel, ON THE TEM EDS VERIFICATION OF TU-TURNBULL MODEL OF DISCONTINUOUS DISSOLUTION, Scripta metallurgica et materialia, 30(9), 1994, pp. 1177-1181
Authors:
SINCLAIR R
MORGIEL J
KIRTIKAR AS
WU IW
CHIANG A
Citation: R. Sinclair et al., DIRECT OBSERVATION OF CRYSTALLIZATION IN SILICON BY IN-SITU HIGH-RESOLUTION ELECTRON-MICROSCOPY, Ultramicroscopy, 51(1-4), 1993, pp. 41-45