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Results: 1-13 |
Results: 13
SURFACE SMOOTHING AND PATTERNING OF SIC BY FOCUSED ION-BEAMS
Authors: MENZEL R BACHMANN T MACHALETT F WESCH W LANG U WENDT M MUSIL C MUHLE R
Citation: R. Menzel et al., SURFACE SMOOTHING AND PATTERNING OF SIC BY FOCUSED ION-BEAMS, Applied surface science, 136(1-2), 1998, pp. 1-7
INVESTIGATIONS ON LIQUID ALLOY ION SOURCES FOR RARE-EARTH ELEMENTS
Authors: MACHALETT F WESCH W MUHLE R BARTH S
Citation: F. Machalett et al., INVESTIGATIONS ON LIQUID ALLOY ION SOURCES FOR RARE-EARTH ELEMENTS, Review of scientific instruments, 69(3), 1998, pp. 1336-1339
INVESTIGATIONS ON LIQUID ALLOY ION SOURCES FOR RARE-EARTH ELEMENTS (ABSTRACT)
Authors: MACHALETT F WESCH W MUHLE R BARTH S
Citation: F. Machalett et al., INVESTIGATIONS ON LIQUID ALLOY ION SOURCES FOR RARE-EARTH ELEMENTS (ABSTRACT), Review of scientific instruments, 69(2), 1998, pp. 852-852
SPUTTERING AND DEFECT PRODUCTION BY FOCUSED GOLD CLUSTER ION-BEAM IRRADIATION OF SILICON
Authors: DOBELI M NEBIKER PW MUHLE R SUTER M
Citation: M. Dobeli et al., SPUTTERING AND DEFECT PRODUCTION BY FOCUSED GOLD CLUSTER ION-BEAM IRRADIATION OF SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 132(4), 1997, pp. 571-577
MINIMIZING RADIATION-DAMAGE IN SILICON STRUCTURED WITH LOW-ENERGY FOCUSED ION-BEAMS
Authors: NEBIKER PW DOBELI M MUHLE R SUTER M
Citation: Pw. Nebiker et al., MINIMIZING RADIATION-DAMAGE IN SILICON STRUCTURED WITH LOW-ENERGY FOCUSED ION-BEAMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 897-900
ROLE FOR N-COR AND HISTONE DEACETYLASE IN SIN3-MEDIATED TRANSCRIPTIONAL REPRESSION
Authors: ALLAND L MUHLE R HOU H POTES J CHIN L SCHREIBERAGUS N DEPINHO RA
Citation: L. Alland et al., ROLE FOR N-COR AND HISTONE DEACETYLASE IN SIN3-MEDIATED TRANSCRIPTIONAL REPRESSION, Nature, 387(6628), 1997, pp. 49-55
IN-SITU OBSERVATION OF THE TIP SHAPE OF AUGE LIQUID ALLOY ION SOURCESUSING A HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPE
Authors: DRIESEL W DIETZSCH C MUHLE R
Citation: W. Driesel et al., IN-SITU OBSERVATION OF THE TIP SHAPE OF AUGE LIQUID ALLOY ION SOURCESUSING A HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(5), 1996, pp. 3367-3380
LOW-ENERGY ION-BEAM IRRADIATION OF SILICON
Authors: NEBIKER PW DOBELI M MUHLE R SUTER M VETTERLI D
Citation: Pw. Nebiker et al., LOW-ENERGY ION-BEAM IRRADIATION OF SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 113(1-4), 1996, pp. 205-208
PRASEODYMIUM ALLOY ION-SOURCE FOR FOCUSED ION-BEAM IMPLANTATION IN SUPERCONDUCTORS
Authors: MACHALETT F MUHLE R
Citation: F. Machalett et R. Muhle, PRASEODYMIUM ALLOY ION-SOURCE FOR FOCUSED ION-BEAM IMPLANTATION IN SUPERCONDUCTORS, Review of scientific instruments, 67(3), 1996, pp. 1015-1017
INVESTIGATIONS ON AUSI LIQUID ALLOY ION SOURCES
Authors: MUHLE R GERMANN D NEBIKER P
Citation: R. Muhle et al., INVESTIGATIONS ON AUSI LIQUID ALLOY ION SOURCES, Review of scientific instruments, 67(3), 1996, pp. 1374-1374
CHARACTERIZATION OF FOCUSED ION-BEAM-INDUCED DAMAGE
Authors: VETTERLI D DOBELI M MUHLE R NEBIKER PW MUSIL CR
Citation: D. Vetterli et al., CHARACTERIZATION OF FOCUSED ION-BEAM-INDUCED DAMAGE, Microelectronic engineering, 27(1-4), 1995, pp. 339-342
TIP-SHAPE INVESTIGATION OF A AU-SI ALLOY LIQUID-METAL ION-SOURCE USING A HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPE
Authors: DRIESEL W DIETZSCH C MUHLE R
Citation: W. Driesel et al., TIP-SHAPE INVESTIGATION OF A AU-SI ALLOY LIQUID-METAL ION-SOURCE USING A HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPE, Journal of physics. D, Applied physics, 28(4), 1995, pp. 787-793
LIQUID ALLOY ION SOURCES FOR PD AND CU
Authors: MACHALETT F MUHLE R
Citation: F. Machalett et R. Muhle, LIQUID ALLOY ION SOURCES FOR PD AND CU, Journal of physics. D, Applied physics, 27(6), 1994, pp. 1286-1290
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