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Results: 1-9 |
Results: 9
INVESTIGATION OF THE STRUCTURAL-PROPERTIES OF GAAS-LAYERS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES
Authors: GALIEV GB IMAMOV RM MEDVEDEV BK MOKEROV VG MUKHAMEDZHANOV EK PASHAEV EM CHEGLAKOV VB
Citation: Gb. Galiev et al., INVESTIGATION OF THE STRUCTURAL-PROPERTIES OF GAAS-LAYERS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES, Semiconductors, 31(10), 1997, pp. 1003-1005
PHOTOELECTRONS IN X-RAY STANDING-WAVE TECHNIQUE - POTENTIALITIES IN CRYSTAL SUBSURFACE LAYER INVESTIGATION
Authors: MUKHAMEDZHANOV EK
Citation: Ek. Mukhamedzhanov, PHOTOELECTRONS IN X-RAY STANDING-WAVE TECHNIQUE - POTENTIALITIES IN CRYSTAL SUBSURFACE LAYER INVESTIGATION, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 501-511
X-RAY STANDING-WAVE TECHNIQUE AS A SOURCE OF COMPLEMENTARY INFORMATION IN STRUCTURAL CHARACTERIZATION OF THIN SURFACE-LAYERS
Authors: BOCCHI C FRANZOSI P IMAMOV RM MASLOV AV MUKHAMEDZHANOV EK PASHAEV EM
Citation: C. Bocchi et al., X-RAY STANDING-WAVE TECHNIQUE AS A SOURCE OF COMPLEMENTARY INFORMATION IN STRUCTURAL CHARACTERIZATION OF THIN SURFACE-LAYERS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(1), 1997, pp. 65-72
STRUCTURAL-PROPERTIES OF ZN-DIFFUSED INP LAYERS
Authors: BOCCHI C FRANZOSI P PELOSI C MASLOV AV MUKHAMEDZHANOV EK GAMBACORTI N SIMEONE MG AUDINO R
Citation: C. Bocchi et al., STRUCTURAL-PROPERTIES OF ZN-DIFFUSED INP LAYERS, Journal of applied physics, 82(11), 1997, pp. 5416-5421
STRUCTURAL CHARACTERIZATION OF ZN-DIFFUSED INP LAYERS BY X-RAY-DIFFRACTION AND STANDING-WAVES METHOD
Authors: BOCCHI C FRANZOSI P MASLOV AV MUKHAMEDZHANOV EK AUDINO R GAMBACORTI N
Citation: C. Bocchi et al., STRUCTURAL CHARACTERIZATION OF ZN-DIFFUSED INP LAYERS BY X-RAY-DIFFRACTION AND STANDING-WAVES METHOD, Applied physics letters, 69(20), 1996, pp. 3019-3021
EFFECT OF X-RAY-BEAM CONTRACTION IN ASYMM ETRIC DIFFRACTION BY THE GE-CU SYSTEM
Authors: AFANASEV AM IMAMOV RM MUKHAMEDZHANOV EK
Citation: Am. Afanasev et al., EFFECT OF X-RAY-BEAM CONTRACTION IN ASYMM ETRIC DIFFRACTION BY THE GE-CU SYSTEM, Kristallografia, 40(3), 1995, pp. 567-568
POLARIZATION EFFECT AND THE DEPTH OF PHOT OELECTRON OUTCOME IN CRYSTALS
Authors: MUKHAMEDZHANOV EK
Citation: Ek. Mukhamedzhanov, POLARIZATION EFFECT AND THE DEPTH OF PHOT OELECTRON OUTCOME IN CRYSTALS, Fizika tverdogo tela, 36(7), 1994, pp. 2046-2056
THE DETERMINATION OF THE PROBABILITY OF E SCAPE OF PHOTOELECTRONS OF VARIOUS ENERGIES
Authors: AFANASEV AM IMAMOV RM IGAMKULOV ZA MUKHAMEDZHANOV EK
Citation: Am. Afanasev et al., THE DETERMINATION OF THE PROBABILITY OF E SCAPE OF PHOTOELECTRONS OF VARIOUS ENERGIES, Kristallografia, 39(2), 1994, pp. 250-257
INVESTIGATION OF LATTICE-DISTORTIONS IN INP CRYSTALS IMPLANTED WITH FE-RESOLUTION X-RAY-DIFFRACTION AND X-RAY STANDING-WAVE METHODS( IONS BY MEANS OF HIGH)
Authors: BOCCHI C FRANZOSI P IMAMOV RM LOMOV AA MASLOV AV MUKHAMEDZHANOV EK YAKOVCHICK YV
Citation: C. Bocchi et al., INVESTIGATION OF LATTICE-DISTORTIONS IN INP CRYSTALS IMPLANTED WITH FE-RESOLUTION X-RAY-DIFFRACTION AND X-RAY STANDING-WAVE METHODS( IONS BY MEANS OF HIGH), Journal of applied physics, 76(11), 1994, pp. 7239-7245
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