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Results: 1-25/27
Authors:
KANEKO K
GEMMING T
TANAKA I
MULLEJANS H
Citation: K. Kaneko et al., ANALYTICAL INVESTIGATION OF RANDOM GRAIN-BOUNDARIES OF ZR-DOPED SINTERED ALPHA-AL2O3 BY TRANSMISSION ELECTRON-MICROSCOPY AND SCANNING-TRANSMISSION ELECTRON-MICROSCOPY, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 77(5), 1998, pp. 1255-1272
Authors:
FRENCH RH
MULLEJANS H
JONES DJ
DUSCHER G
CANNON RM
RUHLE M
Citation: Rh. French et al., DISPERSION FORCES AND HAMAKER CONSTANTS FOR INTERGRANULAR FILMS IN SILICON-NITRIDE FROM SPATIALLY RESOLVED-VALENCE ELECTRON-ENERGY-LOSS SPECTRUM IMAGING, Acta materialia, 46(7), 1998, pp. 2271-2287
Authors:
DORNEICH AD
FRENCH RH
MULLEJANS H
LOUGHIN S
RUHLE M
Citation: Ad. Dorneich et al., QUANTITATIVE-ANALYSIS OF VALENCE ELECTRON-ENERGY-LOSS SPECTRA OF ALUMINUM NITRIDE, Journal of Microscopy, 191, 1998, pp. 286-296
Authors:
FRENCH RH
MULLEJANS H
JONES DJ
Citation: Rh. French et al., OPTICAL-PROPERTIES OF ALUMINUM-OXIDE - DETERMINED FROM VACUUM-ULTRAVIOLET AND ELECTRON-ENERGY-LOSS SPECTROSCOPIES, Journal of the American Ceramic Society, 81(10), 1998, pp. 2549-2557
Authors:
CEH M
GU H
MULLEJANS H
RECNIK A
Citation: M. Ceh et al., ANALYTICAL ELECTRON-MICROSCOPY OF PLANAR FAULTS IN SRO-DOPED CATIO3, Journal of materials research, 12(9), 1997, pp. 2438-2446
Authors:
ALBER U
MULLEJANS H
RUHLE M
Citation: U. Alber et al., IMPROVED QUANTIFICATION OF GRAIN-BOUNDARY SEGREGATION BY EDS IN A DEDICATED STEM, Ultramicroscopy, 69(2), 1997, pp. 105-116
Authors:
KOSTLMEIER S
ELSASSER C
MEYER B
MULLEJANS H
Citation: S. Kostlmeier et al., AB-INITIO CALCULATION OF ELNES (ENERGY-LO SS NEAR-EDGE STRUCTURE) SPECTRA IN OXIDES, European journal of cell biology, 74, 1997, pp. 26-26
Authors:
THOMAS J
KIENZLE O
MULLEJANS H
RUHLE M
Citation: J. Thomas et al., SUPPRESSION OF ARTIFACTS OF FE, NI AND CU IN EDX ELEMENTAL ANALYSIS USING A VG HB-501 STEM, European journal of cell biology, 74, 1997, pp. 87-87
Authors:
DEHM G
ERNST F
MAYER J
MOBUS G
MULLEJANS H
PHILLIPP F
SCHEU C
RUHLE M
Citation: G. Dehm et al., TRANSMISSION ELECTRON-MICROSCOPY AT THE MAX-PLANCK-INSTITUT FUR METALLFORSCHUNG, Zeitschrift fur Metallkunde, 87(11), 1996, pp. 898-910
Authors:
RUHLE M
MULLEJANS H
MAYER J
FRENCH RH
RAJ R
Citation: M. Ruhle et al., INTERNATIONAL-SYMPOSIUM ON ATOMIC BONDING AT INTERNAL INTERFACES - MODELING AND SPECTROSCOPY - FOREWORD, Journal of physics. D, Applied physics, 29(7), 1996, pp. 5-5
Authors:
YANG JC
SCHUMANN E
MULLEJANS H
RUHLE M
Citation: Jc. Yang et al., CHEMISTRY AND BONDING INVESTIGATIONS OF NIAL GAMMA-AL2O3 INTERFACES/, Journal of physics. D, Applied physics, 29(7), 1996, pp. 1716-1724
Authors:
MULLEJANS H
FRENCH RH
Citation: H. Mullejans et Rh. French, INTERBAND ELECTRONIC-STRUCTURE OF A NEAR-SIGMA-11 GRAIN-BOUNDARY IN ALPHA-ALUMINA DETERMINED BY SPATIALLY-RESOLVED VALENCE ELECTRON-ENERGY-LOSS SPECTROSCOPY, Journal of physics. D, Applied physics, 29(7), 1996, pp. 1751-1760
Authors:
SCHEU C
DEHM G
MULLEJANS H
BRYDSON R
RUHLE M
Citation: C. Scheu et al., ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE OF METAL-ALUMINA INTERFACES, Microscopy microanalysis microstructures, 6(1), 1995, pp. 19-31
Authors:
GRIFFITHS M
MULLEJANS H
Citation: M. Griffiths et H. Mullejans, A TEM STUDY OF ALPHA-PHASE STABILITY IN ZR-2.5 NB PRESSURE TUBES FOLLOWING NEUTRON-IRRADIATION (A TEM STUDY OF ALPHA-PHASE STABILITY), Micron, 26(6), 1995, pp. 555-557
Authors:
PRIELIPP H
KNECHTEL M
CLAUSSEN N
STREIFFER SK
MULLEJANS H
RUHLE M
RODEL J
Citation: H. Prielipp et al., STRENGTH AND FRACTURE-TOUGHNESS OF ALUMINUM ALUMINA COMPOSITES WITH INTERPENETRATING NETWORKS, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 197(1), 1995, pp. 19-30
Authors:
BRYDSON R
BRULEY J
MULLEJANS H
SCHEU C
RUHLE M
Citation: R. Brydson et al., MODELING THE BONDING AT METAL-CERAMIC INTERFACES USING PEELS IN THE STEM, Ultramicroscopy, 59(1-4), 1995, pp. 81-92
Authors:
GU H
CEH M
STEMMER S
MULLEJANS H
RUHLE M
Citation: H. Gu et al., A QUANTITATIVE APPROACH FOR SPATIALLY-RESOLVED ELECTRON-ENERGY-LOSS SPECTROSCOPY OF GRAIN-BOUNDARIES AND PLANAR DEFECTS ON A SUBNANOMETER SCALE, Ultramicroscopy, 59(1-4), 1995, pp. 215-227
Authors:
GATTS C
DUSCHER G
MULLEJANS H
RUHLE M
Citation: C. Gatts et al., ANALYZING LINE SCAN EELS DATA WITH NEURAL PATTERN-RECOGNITION, Ultramicroscopy, 59(1-4), 1995, pp. 229-239
Authors:
MULLEJANS H
BRULEY J
Citation: H. Mullejans et J. Bruley, ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE OF INTERNAL INTERFACES BY SPATIAL DIFFERENCE SPECTROSCOPY, Journal of Microscopy, 180, 1995, pp. 12-21
Authors:
BRYDSON R
MULLEJANS H
BRULEY J
TRUSTY PA
SUN X
YEOMANS JA
RUHLE M
Citation: R. Brydson et al., SPATIALLY-RESOLVED ELECTRON-ENERGY-LOSS STUDIES OF METAL-CERAMIC INTERFACES IN TRANSITION-METAL ALUMINA CERMETS, Journal of Microscopy, 177, 1995, pp. 369-386
Authors:
KAPLAN WD
MULLEJANS H
RUHLE M
RODEL J
CLAUSSEN N
Citation: Wd. Kaplan et al., CA SEGREGATION TO BASAL SURFACES IN ALPHA-ALUMINA, Journal of the American Ceramic Society, 78(10), 1995, pp. 2841-2844
Authors:
KNECHTEL M
PRIELIPP H
MULLEJANS H
CLAUSSEN N
RODEL J
Citation: M. Knechtel et al., MECHANICAL-PROPERTIES OF AL AL2O3 AND CU/AL2O3 COMPOSITES WITH INTERPENETRATING NETWORKS/, Scripta metallurgica et materialia, 31(8), 1994, pp. 1085-1090
Authors:
BRULEY J
BRYDSON R
MULLEJANS H
MAYER J
GUTEKUNST G
MADER W
KNAUSS D
RUHLE M
Citation: J. Bruley et al., INVESTIGATIONS OF THE CHEMISTRY AND BONDING AT NIOBIUM-SAPPHIRE INTERFACES, Journal of materials research, 9(10), 1994, pp. 2574-2583
Authors:
MULLEJANS H
BRULEY J
Citation: H. Mullejans et J. Bruley, IMPROVEMENTS IN DETECTION SENSITIVITY BY SPATIAL DIFFERENCE ELECTRON-ENERGY-LOSS SPECTROSCOPY AT INTERFACES IN CERAMICS, Ultramicroscopy, 53(4), 1994, pp. 351-360
Authors:
MULLEJANS H
BRULEY J
Citation: H. Mullejans et J. Bruley, ELECTRON-ENERGY-LOSS SPECTROSCOPY (EELS) - COMPARISON WITH X-RAY-ANALYSIS, Journal de physique. IV, 3(C7), 1993, pp. 2083-2092