Authors:
MUNSTER S
WERNER S
MIHALCEA C
SCHOLZ W
OESTERSCHULZE E
Citation: S. Munster et al., NOVEL MICROMACHINED CANTILEVER SENSORS FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Journal of Microscopy, 186, 1997, pp. 17-22
Authors:
HADJIISKI L
MUNSTER S
OESTERSCHULZE E
KASSING R
Citation: L. Hadjiiski et al., NEURAL-NETWORK CORRECTION OF NONLINEARITIES IN SCANNING PROBE MICROSCOPE IMAGES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1563-1568