Authors: Schenkel, T Hamza, AV Newman, MW Machicoane, G McDonald, JW Schneider, DH Wu, KJ Liechtenstein, VK

Citation: T. Schenkel et al., Transport of hollow atoms through thin dielectric films, PHYS SCR, T92, 2001, pp. 208-210

Authors: Briand, JP Giardino, G Borsoni, G Le Roux, V Bechu, N Dreuil, S Tuske, O Machicoane, G

Citation: Jp. Briand et al., The interaction of slow highly charged ions on surfaces (invited), REV SCI INS, 71(2), 2000, pp. 627-630

Authors: Schenkel, T Hamza, AV Barnes, AV Newman, MW Machicoane, G Niedermayer, T Hattass, M McDonald, JW Schneider, DH Wu, KJ Odom, RW

Citation: T. Schenkel et al., Surface analysis by highly charged ion based secondary ion mass spectrometry, PHYS SCR, T80A, 1999, pp. 73-75

Authors: Briand, JP Le Roux, V Bechu, N Dreuil, S Machicoane, G Prior, M Xie, Z

Citation: Jp. Briand et al., The hollow atoms, NUCL INST B, 154(1-4), 1999, pp. 166-173