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Results:
1-13
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Results: 13
Authors:
Lettieri, S
Maddalena, P
Odierna, LP
Ninno, D
La Ferrara, V
Di Francia, G
Citation: S. Lettieri et al., Measurements of the nonlinear refractive index of freestanding porous silicon layers at different wavelengths, PHIL MAG B, 81(2), 2001, pp. 133-139
Authors:
Bernini, U
Lettieri, S
Maddalena, P
Vitiello, R
Di Francia, G
Citation: U. Bernini et al., Evaluation of the thermal conductivity of porous silicon layers by an optical pump-probe method, J PHYS-COND, 13(5), 2001, pp. 1141-1150
Authors:
De Filippo, F
de Lisio, C
Maddalena, P
Lerondel, G
Yao, T
Altucci, C
Citation: F. De Filippo et al., Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation, APPL PHYS A, 73(6), 2001, pp. 737-740
Authors:
Di Francia, G
La Ferrara, V
Morvillo, P
Lettieri, S
Maddalena, P
Citation: G. Di Francia et al., Self-assembly of photoluminescent silicon films: Influence of doping on the physical properties, APPL PHYS L, 79(14), 2001, pp. 2202-2204
Authors:
Lettieri, S
Fiore, O
Maddalena, P
Morra, A
Ninno, D
Citation: S. Lettieri et al., Third-order nonlinear refraction in porous silicon: theory versus experiment, PHIL MAG B, 80(4), 2000, pp. 587-597
Authors:
De Filippo, F
de Lisio, C
Maddalena, P
Lerondel, G
Altucci, C
Citation: F. De Filippo et al., Measurement of porous silicon dielectric constant by VUV laser harmonic radiation, PHYS ST S-A, 182(1), 2000, pp. 261-266
Authors:
Parretta, A
Grillo, P
Maddalena, P
Tortora, P
Citation: A. Parretta et al., Method for measurement of the directional/hemispherical reflectance of photovoltaic devices, OPT COMMUN, 186(1-3), 2000, pp. 1-14
Authors:
Bernini, U
Maddalena, P
Massera, E
Ramaglia, A
Citation: U. Bernini et al., Photo-acoustic characterization of porous silicon samples, J OPT A-P A, 1(2), 1999, pp. 210-213
Authors:
Santamato, E
Abbate, G
Maddalena, P
Marrucci, L
Paparo, D
Piccirillo, B
Citation: E. Santamato et al., Dynamical regimes and motion intermittence induced by a laser beam in a nematic liquid crystal film, MOL CRYST A, 328, 1999, pp. 479-487
Authors:
Tescione, D
Maddalena, P
Citation: D. Tescione et P. Maddalena, A new technique for calibration in frequency of piezoelectric transducers, NDT E INT, 32(2), 1999, pp. 71-77
Authors:
Parretta, A
Sarno, A
Tortora, P
Yakubu, H
Maddalena, P
Zhao, JH
Wang, AH
Citation: A. Parretta et al., Angle-dependent reflectance measurements on photovoltaic materials and solar cells, OPT COMMUN, 172(1-6), 1999, pp. 139-151
Authors:
Lettieri, S
Fiore, O
Maddalena, P
Ninno, D
Di Francia, G
La Ferrara, V
Citation: S. Lettieri et al., Nonlinear optical refraction of free-standing porous silicon layers, OPT COMMUN, 168(5-6), 1999, pp. 383-391
Authors:
Bernini, U
Maddalena, P
Massera, E
Ramaglia, A
Citation: U. Bernini et al., Thermal characterization of porous silicon via thermal wave interferometry, OPT COMMUN, 168(1-4), 1999, pp. 305-314
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