Authors:
Klehr, A
Beister, G
Erbert, G
Klein, A
Maege, J
Rechenberg, I
Sebastian, J
Wenzel, H
Trankle, G
Citation: A. Klehr et al., Defect recognition via longitudinal mode analysis of high power fundamental mode and broad area edge emitting laser diodes, J APPL PHYS, 90(1), 2001, pp. 43-47
Authors:
Knauer, A
Erbert, G
Wenzel, H
Bhattacharya, A
Bugge, F
Maege, J
Pittroff, W
Sebastian, J
Citation: A. Knauer et al., 7W CW power from tensile-strained GaAsyP1-y/AlGaAs (lambda = 735 nm) QW diode lasers, ELECTR LETT, 35(8), 1999, pp. 638-639
Authors:
Beister, G
Erbert, G
Knauer, A
Maege, J
Ressel, P
Sebastian, J
Staske, R
Wenzel, H
Citation: G. Beister et al., High-power and high temperature long-term stability of Al-free 950nm laserstructures on GaAs, ELECTR LETT, 35(19), 1999, pp. 1641-1643